This paper presents a risk-based approach for quality control planning of complex discrete
manufacturing processes, to prevent massive scraps to occur. An analytical model is …

This paper presents a general methodology to improve risk assessment in the specific
workshops of semiconductor manufacturers. We are concerned, in this case, with the …

Semiconductor manufacturing processes are very long and complex, needing several
hundreds of individual steps to produce the final product (chip). In this context, the early …

Process variables in manufacturing process are critical to the final quality of product,
especially in continuous process. Their abnormal fluctuations may cause many quality …

Inspired by semiconductor manufacturing, this paper studies a system where the products
processed on multiple production machines are sampled to be measured on a single …

This paper studies the effect of type-II inspection errors on the effectiveness of a quality
inspection plan designed utilizing a risk exposure control approach. To do so, the probability …

Aim: Recent mediatic recalls of products illustrate the losses in terms of cost and reputation
induced by non-conformities reaching end customer. The purpose of this paper is to master …

This paper proposes an estimation method for the confidence level of feedback information
(CLFI), namely the confidence level of reported information in computer integrated …

Les évolutions scientifiques survenues ces deux dernières décennies en productique ont eu
vocation à conférer plus d'automatisation aux équipements, à définir de nouvelles …

The paper proposes a mathematical model to forecast the time needed during a continuous
improvement (CI) project. To do this, the authors adapted the famous Lotka–Volterra model …