Secondary ion mass spectrometry
Secondary ion mass spectrometry (SIMS) is a technique for chemical analysis and imaging
of solid materials, with applications in many areas of science and technology. It involves …
of solid materials, with applications in many areas of science and technology. It involves …
[HTML][HTML] A novel ToF-SIMS operation mode for sub 100 nm lateral resolution: Application and performance
A novel operation mode for time of flight-secondary ion mass spectrometry (ToF-SIMS) is
described for a TOF. SIMS 5 instrument with a Bi-ion gun. It features sub 100 nm lateral …
described for a TOF. SIMS 5 instrument with a Bi-ion gun. It features sub 100 nm lateral …
CHILI–the Chicago Instrument for Laser Ionization–a new tool for isotope measurements in cosmochemistry
We describe CHILI, the Chicago Instrument for Laser Ionization, a new resonance ionization
mass spectrometer developed for isotopic analysis at high spatial resolution and high …
mass spectrometer developed for isotopic analysis at high spatial resolution and high …
SIMS of organics—Advances in 2D and 3D imaging and future outlook
IS Gilmore - Journal of Vacuum Science & Technology A, 2013 - pubs.aip.org
Secondary ion mass spectrometry (SIMS) has become a powerful technique for the label-
free analysis of organics from cells to electronic devices. The development of cluster ion …
free analysis of organics from cells to electronic devices. The development of cluster ion …
A novel ToF-SIMS operation mode for improved accuracy and lateral resolution of oxygen isotope measurements on oxides
Oxygen isotope exchange with subsequent time-of-flight secondary ion mass spectrometry
(ToF-SIMS) is a highly valuable tool for determining oxygen diffusion coefficients in oxides …
(ToF-SIMS) is a highly valuable tool for determining oxygen diffusion coefficients in oxides …
Validated analysis of component distribution inside perovskite solar cells and its utility in unveiling factors of device performance and degradation
Time-of-flight secondary-ion mass spectrometry (ToF-SIMS) has been used for gaining
insights into perovskite solar cells (PSCs). However, the importance of selecting ion beam …
insights into perovskite solar cells (PSCs). However, the importance of selecting ion beam …
ToF-SIMS analysis of ultrathin films and their fragmentation patterns
S Muramoto, DJ Graham, DG Castner - Journal of Vacuum Science & …, 2024 - pubs.aip.org
Organic thin films are of great interest due to their intriguing interfacial and functional
properties, especially for device applications such as thin-film transistors and sensors. As …
properties, especially for device applications such as thin-film transistors and sensors. As …
Correction of dead time effects in laser-induced desorption time-of-flight mass spectrometry: Applications in atom probe tomography
Dead time effects in time-of-flight secondary ion mass spectrometry are well known and can
be corrected for using Poisson statistics. Laser-induced desorption, however, introduces …
be corrected for using Poisson statistics. Laser-induced desorption, however, introduces …
Study of experimental variability in TOF-SIMS mass spectrometry imaging of biological samples
C Bich, D Touboul, A Brunelle - International Journal of Mass Spectrometry, 2013 - Elsevier
Studies of the chemical composition of organs using mass spectrometry imaging become an
important issue to better understand the mechanisms involved in various diseases …
important issue to better understand the mechanisms involved in various diseases …
Dead‐time correction for time‐of‐flight secondary‐ion mass spectral images: a critical issue in multivariate image analysis
BJ Tyler, RE Peterson - Surface and interface analysis, 2013 - Wiley Online Library
Dead‐time effects result in a non‐linear detector response in the common time‐of‐flight
secondary‐ion mass spectrometry instruments. This can result in image artifacts that can …
secondary‐ion mass spectrometry instruments. This can result in image artifacts that can …