Total ionizing dose (TID) impact on basic amplifier stages
This paper discusses the impact of total ionizing dose (TID) on basic amplifier stages that
are biased right above the device threshold voltages. Existing TID degradation-aware …
are biased right above the device threshold voltages. Existing TID degradation-aware …
The Circuit Technique for Reducing the Zero Level of the JFET Op-Amp on the Push-Pull Folded-Cascode
N Prokopenko, A Titov, V Chumakov… - … Multi-Conference on …, 2022 - ieeexplore.ieee.org
In the paper, the authors describe the improved operational amplifier architecture (op-amp).
Complementary FETs with the pn-junction control were used in the design of this op-amp …
Complementary FETs with the pn-junction control were used in the design of this op-amp …