Atom probe tomography for catalysis applications: a review
Atom probe tomography is a well-established analytical instrument for imaging the 3D
structure and composition of materials with high mass resolution, sub-nanometer spatial …
structure and composition of materials with high mass resolution, sub-nanometer spatial …
Silicon nanoscale materials: From theoretical simulations to photonic applications
L Khriachtchev, S Ossicini, F Iacona… - International Journal …, 2012 - Wiley Online Library
The combination of photonics and silicon technology is a great challenge because of the
potentiality of coupling electronics and optical functions on a single chip. Silicon …
potentiality of coupling electronics and optical functions on a single chip. Silicon …
Correlation of microphotoluminescence spectroscopy, scanning transmission electron microscopy, and atom probe tomography on a single nano-object containing an …
A single nanoscale object containing a set of InGaN/GaN nonpolar multiple-quantum wells
has been analyzed by microphotoluminescence spectroscopy (μPL), high-resolution …
has been analyzed by microphotoluminescence spectroscopy (μPL), high-resolution …
Nano-composite MOx materials for NVMs
C Bonafos, L Khomenkhova, F Gourbilleau… - Metal Oxides for Non …, 2022 - Elsevier
In this chapter, we will present a digest of the main materials science aspects of the
controlled fabrication of 2D arrays of semiconducting (Si, Ge) nanocrystals (NCs) in metal …
controlled fabrication of 2D arrays of semiconducting (Si, Ge) nanocrystals (NCs) in metal …
Nanoscale evidence of erbium clustering in Er-doped silicon-rich silica
Photoluminescence spectroscopy and atom probe tomography were used to explore the
optical activity and microstructure of Er 3+-doped Si-rich SiO 2 thin films fabricated by radio …
optical activity and microstructure of Er 3+-doped Si-rich SiO 2 thin films fabricated by radio …
Confined phase separation in SiOx nanometric thin layers
Phase separation in silicon-rich silica/silica multilayers was investigated using Atom Probe
Tomography and Atomistic Kinetic Monte Carlo simulation. It is shown that the thickness of …
Tomography and Atomistic Kinetic Monte Carlo simulation. It is shown that the thickness of …
Phase transformation in SiOx/SiO2 multilayers for optoelectronics and microelectronics applications
Due to the quantum confinement, silicon nanoclusters (Si-ncs) embedded in a dielectric
matrix are of prime interest for new optoelectronics and microelectronics applications. In this …
matrix are of prime interest for new optoelectronics and microelectronics applications. In this …
Evolution of shape, size, and areal density of a single plane of Si nanocrystals embedded in SiO 2 matrix studied by atom probe tomography
Single planes of Si nanocrystals (NCs) embedded in a SiO2 matrix were synthesized by
annealing SiO2/SiO/SiO2 multilayer structures deposited on Si (100) substrates by e-beam …
annealing SiO2/SiO/SiO2 multilayer structures deposited on Si (100) substrates by e-beam …
Atom probe tomography of nanoscale architectures in functional materials for electronic and photonic applications
Microscopy has played a central role in the advancement of nanoscience and
nanotechnology by enabling the direct visualization of nanoscale structure, leading to …
nanotechnology by enabling the direct visualization of nanoscale structure, leading to …
Atom probe tomography of size‐controlled phosphorus doped silicon nanocrystals
Doping of silicon nanocrystals is essential to control their electronic and optical properties.
The incorporation of an impurity into a silicon nanovolume is a nontrivial task due to the self …
The incorporation of an impurity into a silicon nanovolume is a nontrivial task due to the self …