This book is a comprehensive guide to new DFT methods that will show the readers how to
design a testable and quality product, drive down test cost, improve product quality and …

Modern electronics testing has a legacy of more than 40 years. The introduction of new
technologies, especially nanometer technologies with 90nm or smaller geometry, has …

This paper presents a morphology-based method for detecting license plates from cluttered
images. The proposed system consists of three major components. At the first, a morphology …

We present a SAT-based ATPG tool targeting on a path-oriented transition fault model.
Under this fault model, a transition fault is detected through the longest sensitizable path. In …

Process variations make at-speed testing significantly more difficult. They cause subtle delay
changes that are distributed in contrast to the localized nature of a traditional fault model …

Transistor aging results in circuit delay degradation over time, and is a growing concern for
future systems. On-line circuit failure prediction, together with on-line self-test, can overcome …

Modern supervised learning algorithms can learn very accurate and complex discriminating
functions. But when these classifiers fail, this complexity can also be a drawback because …

In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG.
The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a …

The work presents a new transition fault model called as late as possible transition fault
(ALAPTF) model. The model aims at detecting smaller delays, which be missed by both the …

Interconnect-based defects such as partial opens are becoming more prevalent in
nanoscale designs. These are latent defects that affect circuit reliability and can be modeled …