This paper presents a short review for phase measuring deflectometry (PMD). PMD is a
phase calculation based technique for three-dimensional (3D) measurement of specular …

The fast development in the fields of integrated circuits, photovoltaics, the automobile
industry, advanced manufacturing, and astronomy have led to the importance and necessity …

Vision-based defect detection techniques are widely used for quality control purposes. In
this work, an efficient deflectometry based detection system is developed for semi …

A new method is presented for reconstruction of the shape of specular surfaces using
scanning beam deflectometry. A description and an analysis of a deflectometric technique …

A compact scanning deflectometer is presented for the fast topography measurement of
semiconductor wafers. The technique, however, is equally well suited for any flat or slightly …

In this work we provide a theoretical analysis of gradient deflectometric method for 3D
topography measurements of optically smooth surfaces. It is shown that the surface …

There are many optical metrological techniques to determine the profile of a surface or a
wave-front. A group of them are based on the measurements of the profile slopes, like …

Este trabajo nace de un proyecto europeo cuyo objetivo es la mejora en la calidad de la
medida de la planitud de superficies, como por ejemplo obleas, pantallas de cristal líquido …

The European Extremely Large Telescope will be a large optical/infrared telescope with a
segmented primary mirror of 42-m diameter, and 84-m radius of curvature. Each segment …

With'Banana Technology'an unconventional hybrid fabrication technology is indicated for
the production of very large parabolic and hyperbolic cylindrical mirror systems. The banana …