Hypo-eutectic microstructure formation and nanomechanical response in Sn-3.0 Ag-0.5 Cu solder balls: effects of undercooling

B Wang, XJ Hu, W Sun, JL Liao, HL Peng, N Hou… - Materials …, 2023 - Elsevier
The microstructure control and refinement in length scale are pursued in the development of
next generations of Pb-free solder alloys with high reliability in harsh environments. In the …

Visualization of microstructural evolution in lead free solders during isothermal aging using time-lapse imagery

N Fu, S Ahmed, JC Suhling… - 2017 IEEE 67th Electronic …, 2017 - ieeexplore.ieee.org
In this investigation, Scanning Electron Microscopy (SEM) and Scanning Probe Microscopy
(SPM) have been utilized to examine aging induced microstructural changes occurring …

Development of holmium doped eutectic Sn-Ag lead-free solder for electronic packaging

RM Shalaby - Soldering & Surface Mount Technology, 2022 - emerald.com
Development of holmium doped eutectic Sn-Ag lead-free solder for electronic packaging |
Emerald Insight Books and journals Case studies Expert Briefings Open Access Publish with us …

On the anisotropic indentation modulus and anisotropic creep behavior of β-Sn characterized by nanoindentation methods

B Ernst, S Keim, U Tetzlaff - Materials Science and Engineering: A, 2022 - Elsevier
The influence of the orientation on the indentation modulus, the hardness and the creep
properties of high purity β-Sn (wt.%: 99.999) have been examined. Nanoindentation …

[HTML][HTML] Optimization of mechanical properties of Sn-3.8 Ag-0.7 Cu alloys by the additions of Bi, In and Ti

Y Chen, K You, S Yu, T Yang, Z Dong, J Zhang… - Progress in Natural …, 2022 - Elsevier
Abstract Bi, In and Ti were added to Sn-3.8 Ag-0.7 Cu (SAC387) solder alloy to optimize the
mechanical performance. The alloying effects of Bi, In and Ti on the microstructure, thermal …

Evolution of the cyclic stress-strain and constitutive behaviors of doped lead free solder during fatigue testing

MA Hoque, MM Chowdhury, N Fu… - 2018 17th IEEE …, 2018 - ieeexplore.ieee.org
One of the most common method of failure in electronic packaging is the fatigue failure of
solder joints. The constituent materials forming the electronic assembly have different …

The anand parameters of aging resistant doped solder alloys

S Ahmed, JC Suhling, P Lall - 2017 16th IEEE Intersociety …, 2017 - ieeexplore.ieee.org
Due to growing environmental concerns, lead-free solder materials are being widely used in
electronic assemblies. The Anand viscoplastic constitutive model is frequently used to …

Characterization of material damage and microstructural evolution occurring in lead free solders subjected to cyclic loading

MM Chowdhury, MA Hoque, N Fu… - 2018 IEEE 68th …, 2018 - ieeexplore.ieee.org
In this investigation, the effects of isothermal mechanical cycling on damage accumulation in
lead free SAC305 and SAC_Q (SAC+ Bi) solder joints have been explored. In particular, we …

Mechanical characterization of SAC solder joints at high temperature using nanoindentation

S Ahmed, M Hasnine, JC Suhling… - 2017 IEEE 67th …, 2017 - ieeexplore.ieee.org
In this work, we have used nanoindentation methods to explore the creep behavior, and
aging effects of SAC305 solder joints at several elevated testing temperatures from 25 to …

Micromechanical response of SAC305 solder alloy under gamma radiation via nanoindentation approach

WY Wan Yusoff, N Ismail… - Soldering & Surface …, 2023 - emerald.com
Purpose This paper aims to investigate the effect of different doses of gamma radiation on
the micromechanical response (hardness properties and creep behaviour) of 96.5 Sn-3.0 Ag …