Flipping bits in memory without accessing them: An experimental study of DRAM disturbance errors

Y Kim, R Daly, J Kim, C Fallin, JH Lee, D Lee… - ACM SIGARCH …, 2014 - dl.acm.org
Memory isolation is a key property of a reliable and secure computing system--an access to
one memory address should not have unintended side effects on data stored in other …

Rowhammer: A retrospective

O Mutlu, JS Kim - … Transactions on Computer-Aided Design of …, 2019 - ieeexplore.ieee.org
This retrospective paper describes the RowHammer problem in dynamic random access
memory (DRAM), which was initially introduced by Kim et al. at the ISCA 2014 Conference …

The RowHammer problem and other issues we may face as memory becomes denser

O Mutlu - Design, Automation & Test in Europe Conference & …, 2017 - ieeexplore.ieee.org
As memory scales down to smaller technology nodes, new failure mechanisms emerge that
threaten its correct operation. If such failure mechanisms are not anticipated and corrected …

One-sided schmitt-trigger-based 9T SRAM cell for near-threshold operation

K Cho, J Park, TW Oh, SO Jung - IEEE Transactions on Circuits …, 2020 - ieeexplore.ieee.org
This paper presents a one-sided Schmitt-trigger-based 9T static random access memory cell
with low energy consumption and high read stability, write ability, and hold stability yields in …

Leakage characterization of 10T SRAM cell

A Islam, M Hasan - IEEE transactions on electron devices, 2012 - ieeexplore.ieee.org
This paper presents a technique for designing a low-power and variability-aware SRAM cell.
The cell achieves low power dissipation due to its series-connected tail transistor and read …

[图书][B] Robust SRAM designs and analysis

J Singh, SP Mohanty, DK Pradhan - 2012 - books.google.com
This book provides a guide to Static Random Access Memory (SRAM) bitcell design and
analysis to meet the nano-regime challenges for CMOS devices and emerging devices …

Soft-error resilient read decoupled SRAM with multi-node upset recovery for space applications

S Pal, DD Sri, WH Ki, A Islam - IEEE Transactions on Electron …, 2021 - ieeexplore.ieee.org
Space consists of high-energy particles and high-temperature fluctuations, which causes
single event upsets (SEUs). Conventional 6T static random access memory (SRAM) is …

Power-gated 9T SRAM cell for low-energy operation

TW Oh, H Jeong, K Kang, J Park… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
This brief proposes a novel power-gated 9T (PG9T) static random access memory (SRAM)
cell that uses a read-decoupled access buffer and power-gating transistors to execute …

A technique to mitigate impact of process, voltage and temperature variations on design metrics of SRAM Cell

A Islam, M Hasan - Microelectronics reliability, 2012 - Elsevier
This paper presents a technique for designing a variability aware SRAM cell. The
architecture of the proposed cell is similar to the standard 6T SRAM cell with the exception …

Soft error immune RHBD-14t SRAM cell for space and satellite applications

PK Mukku, R Lorenzo - IEEE Access, 2023 - ieeexplore.ieee.org
Deep sub-micron memory devices play a crucial role in space electronic applications due to
their susceptibility to single-event upset and double-node upset types of soft errors. When a …