EA Alam, I Cortes, MP Besland, A Goullet… - Journal of Applied …, 2011 - pubs.aip.org
In this work, SiO 2/GaN MOS structures have been fabricated using Electron Cyclotron Resonance Plasma Enhanced Chemical Vapor Deposition (ECR-PECVD) for deposition of …
M Vila, C Prieto, R Ramı́rez - Thin Solid Films, 2004 - Elsevier
It is presented the effect of the reactive and non-reactive sputtering preparation, as well as, the atomic composition on the electrical properties and conduction mechanisms. Depending …
M Vila, C Prieto, P Miranzo, MI Osendi… - Surface and Coatings …, 2002 - Elsevier
Silicon nitride has excellent properties as a refractory material. Crystalline Si3N4 ceramics exhibit stability at high temperatures, high electrical resistivity and extreme hardness. On the …
We report here on internal stress variations in SiN x films deposited on silicon by plasma enhanced chemical vapor deposition-electron cyclotron resonance (PECVD-ECR) plasma …
M Vila, E Román, C Prieto - Journal of applied physics, 2005 - pubs.aip.org
We have studied the effect of reactive and nonreactive sputtering preparations on the composition and properties of silicon nitride thin films. Films were prepared from both silicon …
A Jalali, MR Vaezi, N Naderi, F Taj Abadi, A Eftekhari - Chemical Papers, 2020 - Springer
In this research, the use of ZnO thin films, as anti-reflective layers of solar cells, is presented. The thin films were synthesized through a sol–gel method and then deposited on a P–N …
M Vila, C Prieto, J Garcıa-López… - Nuclear Instruments and …, 2003 - Elsevier
Silicon nitride thin films have been prepared at room temperature by RF reactive and non- reactive sputtering over several substrates. Pure silicon and high-density ceramic β-Si3N4 …
L Forbes, KY Ahn - US Patent 6,683,337, 2004 - Google Patents
(57) ABSTRACT A method for forming edge-defined Structures with Sub lithographic dimensions which are used to further form conduction channels and/or Storage Structures in …
Amorphous hydrogenated silicon nitride films have been deposited by the electron cyclotron resonance plasma technique, using N 2 and SiH 4 as precursor gases. The gas flow ratio …