Helium, Oxygen, Proton, and Electron (HOPE) mass spectrometer for the radiation belt storm probes mission

HO Funsten, RM Skoug, AA Guthrie… - Space Science …, 2013 - Springer
The HOPE mass spectrometer of the Radiation Belt Storm Probes (RBSP) mission (renamed
the Van Allen Probes) is designed to measure the in situ plasma ion and electron fluxes over …

[HTML][HTML] Low-voltage SEM of air-sensitive powders: From sample preparation to micro/nano analysis with secondary electron hyperspectral imaging

JF Nohl, NTH Farr, Y Sun, GM Hughes, SA Cussen… - Micron, 2022 - Elsevier
Powder materials are used in all corners of materials science, from additive manufacturing to
energy storage. Scanning electron microscopy (SEM) has developed to meet morphological …

An extensive theoretical quantification of secondary electron emission from silicon

MSS Khan, SF Mao, YB Zou, DB Lu, B Da, YG Li… - Vacuum, 2023 - Elsevier
Though intensive experimental studies have been carried out on electron emission
properties in past decades, the reliable data from accurate experimental measurements for …

The contrast‐to‐noise ratio for image quality evaluation in scanning electron microscopy

F Timischl - Scanning, 2015 - Wiley Online Library
The contrast‐to‐noise ratio (CNR) is presented and characterized as a tool for quantitative
noise measurement of scanning electron microscope (SEM) images. Analogies as well as …

Dust–wall and dust–plasma interaction in the MIGRAINe code

L Vignitchouk, P Tolias… - Plasma Physics and …, 2014 - iopscience.iop.org
The physical models implemented in the recently developed dust dynamics code MIGRAINe
are described. A major update of the treatment of secondary electron emission, stemming …

[HTML][HTML] Secondary electron emission from plasma-generated nanostructured tungsten fuzz

M Patino, Y Raitses, R Wirz - Applied Physics Letters, 2016 - pubs.aip.org
Recently, several researchers [eg, Yang et al., Sci. Rep. 5, 10959 (2015)] have shown that
tungsten fuzz can grow on a hot tungsten surface under bombardment by energetic helium …

Electron beam deposition for nanofabrication: Insights from surface science

JD Wnuk, SG Rosenberg, JM Gorham, WF Van Dorp… - Surface Science, 2011 - Elsevier
Electron beam induced deposition (EBID) is a direct-write lithographic technique that utilizes
the dissociation of volatile precursors by a focused electron beam in a low vacuum …

[HTML][HTML] Low energy (1–100 eV) electron inelastic mean free path (IMFP) values determined from analysis of secondary electron yields (SEY) in the incident energy …

OY Ridzel, V Astašauskas, WSM Werner - Journal of Electron Spectroscopy …, 2020 - Elsevier
Since the emission of secondary electrons for any incident energy always involves the
formation and emission of a cascade of slow electrons (< 50 eV) the secondary electron …

On secondary electron emission and its semi-empirical description

P Tolias - Plasma Physics and Controlled Fusion, 2014 - iopscience.iop.org
The description of secondary electron emission, as presented by plasma-material interaction
fusion compendia, is demonstrated to be outdated both in its theoretical and experimental …

Control of electron velocity distributions at the wafer by tailored voltage waveforms in capacitively coupled plasmas to compensate surface charging in high-aspect …

P Hartmann, L Wang, K Nösges, B Berger… - Journal of Physics D …, 2021 - iopscience.iop.org
Low pressure single-or dual-frequency capacitively coupled radio frequency (RF) plasmas
are frequently used for high-aspect ratio (HAR) dielectric etching due to their capability to …