[PDF][PDF] X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

M Stefenelli, J Todt, A Riedl, W Ecker… - Journal of applied …, 2013 - journals.iucr.org
Novel scanning synchrotron cross-sectional nanobeam and conventional laboratory as well
as synchrotron Laplace X-ray diffraction methods are used to characterize residual stresses …

Theoretical Concepts of X-ray Nanoscale Analysis

A Benediktovich, I Feranchuk, A Ulyanenkov - Springer Series in Materials …, 2014 - Springer
X-rays have been proven to be a powerful and reliable tool in studying a large diversity of
micro-and nanoscale objects. The wavelength of X-rays is a perfect fit to the typical sizes of …

Fast pole figure acquisition using area detectors at the DiffAbs beamline–Synchrotron SOLEIL

C Mocuta, MI Richard, J Fouet, S Stanescu… - Applied …, 2013 - journals.iucr.org
Structural anisotropy, for example texture, may govern important physical properties of thin
film, such as electrical, magnetic and/or mechanical ones. Texture (orientation information) …

Structural and elastic properties of ternary metal nitrides TixTa1− xN alloys: First-principles calculations versus experiments

P Djemia, M Benhamida, K Bouamama… - Surface and Coatings …, 2013 - Elsevier
First-principles pseudopotential calculations of the lattice constants and of the single-crystal
elastic constants for TixTa1− xN (0≤ x≤ 1) alloys with B1-rocksalt structure were first carried …

[HTML][HTML] Lateral gradients of phases, residual stress and hardness in a laser heated Ti0. 52Al0. 48N coating on hard metal

M Bartosik, R Daniel, Z Zhang, M Deluca… - Surface and Coatings …, 2012 - Elsevier
The influence of a local thermal treatment on the properties of Ti–Al–N coatings is not
understood. In the present work, a Ti0. 52Al0. 48N coating on a WC–Co substrate was …

Development of a synchrotron biaxial tensile device for in situ characterization of thin films mechanical response

G Geandier, D Thiaudière… - Review of Scientific …, 2010 - pubs.aip.org
We have developed on the DIFFABS-SOLEIL beamline a biaxial tensile machine working in
the synchrotron environment for in situ diffraction characterization of thin polycrystalline films …

Estimation of stress in specimens loaded with ultrasonic fatigue machines

V Jacquemain, N Ranc, C Cheuleu, V Michel… - International Journal of …, 2021 - Elsevier
Piezo-electric ultrasonic fatigue machines are used to carry out fatigue tests more rapidly
than what is possible using other technologies, at a frequency of 20 kHz. The very high cycle …

Micromechanics of substrate-supported thin films

W He, M Han, S Wang, LA Li, X Xue - Acta Mechanica Sinica, 2018 - Springer
The mechanical properties of metallic thin films deposited on a substrate play a crucial role
in the performance of micro/nano-electromechanical systems (MEMS/NEMS) and flexible …

Synchrotron X-ray diffraction experiments with a prototype hybrid pixel detector

C Le Bourlot, P Landois, S Djaziri… - Journal of Applied …, 2012 - journals.iucr.org
A prototype X-ray pixel area detector (XPAD3. 1) has been used for X-ray diffraction
experiments with synchrotron radiation. The characteristics of this detector are very attractive …

Combined synchrotron X-ray and image-correlation analyses of biaxially deformed W/Cu nanocomposite thin films on Kapton

S Djaziri, PO Renault, F Hild, E Le Bourhis… - Journal of Applied …, 2011 - journals.iucr.org
In situ biaxial tensile tests within the elastic domain were conducted with W/Cu
nanocomposite thin films deposited on a polyimide cruciform substrate using a biaxial …