While allowing for the fabrication of increasingly complex and efficient circuitry, transistor
shrinkage and count-per-device expansion have major downsides: chiefly increased …

Process advancements and single-event effects in terrestrial environments have heightened
the importance of fault-tolerant design for FPGA-based digital circuits. This paper presents a …

As the threat of fault susceptibility caused by mechanisms including variation and
degradation increases, engineers must give growing consideration to error detection and …

As process scaling and transistor count inflation continue, silicon chips are becoming
increasingly susceptible to faults. Although FPGAs are particularly vulnerable to these …

While allowing for the fabrication of increasingly complex and efficient circuitry, transistor
shrinkage and count-per-device expansion have major downsides: chiefly increased …