Resolution Enhancement of Scanning Electron Micrographs using Artificial Intelligence
T Reclik, S Medghalchi, P Schumacher… - arXiv preprint arXiv …, 2024 - arxiv.org
Scanning Electron Microscopy (SEM) is pivotal in revealing intricate micro-and nanoscale
features across various research fields. However, obtaining high-resolution SEM images …
features across various research fields. However, obtaining high-resolution SEM images …
Fatigue resistance of deep drawn parts: A scale bridging simulative study using representative volume elements and crystal plasticity simulations
N FEHLEMANN, M HENRICH, M MÜLLER… - Materials Research … - mrforum.com
The mechanical properties of formed components are determined by the interaction
between the microstructure and the load path of the forming process. To investigate and …
between the microstructure and the load path of the forming process. To investigate and …
[引用][C] Preface-Joint Special Issue on Nanomechanical Testing in Materials Research and Development VIII
S Korte-Kerzel, M Sebastiani - Materials Science and Engineering: A, 2024 - Elsevier