Supply current test is well established for digital CMOS circuits and the advantages of
improved observability and reliability indication have prompted its use for analogue and …

A new technique for calculating fault coverage when testing analogue circuits is presented.
The fault models employed for individual circuit components relate to the importance of …

Power supply current monitoring is a promising technique for the development of new test
methodologies for analog and mixed-signal circuits. The advantages of efficiency and …

Transient response testing has developed over the last few years from a benchtop
characterisation technique into a very powerful production test technique for all types of …

Transient response testing has been shown to be a very powerful and economical functional
test technique for linear analogue cells in mixed-signal systems. Unfortunately not all …

This paper initially researches the use of available low-cost analogue CMOS macros to
perform simple on-chip tests on the Analogue to Digital Converter macro. The results are …

A design-for-test (DFT) technique for analogue circuits is proposed which splits all high
current transistors into two. This technique reduces the fault-masking effects of the fault-free …

Transient Response Testing is a powerful test technique for analogue macros in mixed-
signal electronic systems which with some enhancement can be particularly useful for …

Transient Response Testing has been shown to be a very powerful and economical
functional test technique for linear analogue cells in mixed-signal systems. Recently this …

In recent years a number of structural (defect orientated) test methodologies have been
proposed for analogue and mixed signal circuits. They potentially provide shorter test times …