Analytical electron microscopy and Auger electron spectroscopy study of low-temperature diffusion in multilayer chromium–copper–nickel–gold thin films
Analytical electron microscopy and Auger electron spectroscopy were used to study low-
temperature diffusion and segregation in multilayer Cr–Cu–Ni–Au thin films. Annealing at …
temperature diffusion and segregation in multilayer Cr–Cu–Ni–Au thin films. Annealing at …
Low-temperature interdiffusion in binary and multilayer thin film system
SI Sidorenko, SM Voloshko… - Defect and Diffusion …, 1998 - Trans Tech Publ
Thin Film System Page 1 Defect and Diffusion Forum Vol. 156 (1998) pp 215-222 © (1998)
Trans Tech Publications, Switzerland doi: 10.4028/www. scientific. net/DDF. 156.215 Low-Temperature …
Trans Tech Publications, Switzerland doi: 10.4028/www. scientific. net/DDF. 156.215 Low-Temperature …