An electro-thermo-mechanical coupling phase-field model of defect evolution induced by electromigration in interconnects
XW Wu, M Chen, LL Ke - International Journal of Mechanical Sciences, 2025 - Elsevier
In this paper, the defect evolution caused by electromigration induced surface diffusion in
interconnects is investigated using a newly-developed electro-thermo-mechanical coupling …
interconnects is investigated using a newly-developed electro-thermo-mechanical coupling …
Size-dependent melting of gold nanotube: Phase field model and simulations and thermodynamic analytical solution
AT Goki, M Javanbakht - Materials Today Communications, 2024 - Elsevier
In this paper, a phase field (PF) model is used to investigate the melting of Au nanotubes.
The coupled Ginzburg-Landau and elasticity equations are solved to capture the melting …
The coupled Ginzburg-Landau and elasticity equations are solved to capture the melting …