Near-field microwave microscopy provides a means for nondestructive localized
characterization of both surface and subsurface materials and devices. This paper details …

Various techniques are available in order to obtain information on samples of a different
nature in near-field scanning microwave microscopy (NSMM), with transmission-line …

In this paper, we present the design, fabrication and testing of a low-cost non-contact near-
field microwave probe for materials characterization operating at 5.78 GHz. The resonant …

Signal connection in different package substrate layers by PTH via affect the quality of
signals seriously and difficult to measure by traditional methods. In this paper, a new …

This letter proposes a new indirect contact probing method to characterize vertical
interconnections without contact damage. At the first step of the proposed technique …

The evolution of high power transistors has ultimately increased the complexity of their
design, interaction and incorporation within microwave frequency power amplifiers. The …

This article presents a new application of microwave microscopy as a diagnostic of the
painted lightning strike protection (LSP) mesh used in composite aircraft skins. A new …

This thesis addresses circuits and systems optimized for the unique requirements of near-
field microwave microscopy (NFMM). A suite of qualification measurements is conducted for …

In this paper, an indirect contact probing method for via arrays is proposed. The proposed
method characterizes via arrays without contact damage from probe tips, and it does not …

As a solution to the need for efficient characterization of the vertical interconnection array,
this paper presents an indirect contact probing method, adopting a dielectric contactor. The …