Kelvin probe force microscopy (KPFM) is a tool that enables nanometer-scale imaging of the
surface potential on a broad range of materials. KPFM measurements require an …

In this report we review the fundamentals, applications and future tendencies of dynamic
atomic force microscopy (AFM) methods. Our focus is on understanding why the changes …

Kelvin probe force microscopy is a scanning probe technique capable of mapping the local
surface potential or work function on various surfaces with high spatial resolution. This …

Atomically resolved dynamic force microscopy (DFM) images of step and kink sites of NaCl
films grown on the Cu (111) surface are presented. Combining experimental results with an …

A new analog frequency modulation (FM) detector (demodulator) for dynamic force
microscopy (DFM) is presented. The detector is designed for DFM by utilizing the FM …

This article describes the design of a versatile ultrahigh vaccum (UHV) low temperature
scanning force microscope system. The system allows scanning probe microscopy …

Interfacial phenomena at solid/water interfaces play an important role in a wide range of
industrial technologies and biological processes. However, it has been a great challenge to …

Experimental aspects of measuring dissipation on atomic scale using large-amplitude
dynamic force microscopy are discussed. Dissipation versus distance curves reveal that …

The physics of semiconductors has seen an enormous evolution within the last? fty years.
Countless achievements have been made in scienti? c research and device applications …

Atomic resolution images of Cu (111) and Cu (100) surfaces obtained in ultrahigh vacuum
with a combined scanning tunneling (STM)/atomic force microscope (AFM) are presented …