The operational amplifier (op amp) is one of the most encountered analog building blocks. In
this paper, the problem of testing an integrated op amp is treated. A new low-cost vectorless …

Supply current test is well established for digital CMOS circuits and the advantages of
improved observability and reliability indication have prompted its use for analogue and …

This paper explores the applicability of Iddq testing to the field of analog circuits. An attempt
is made to categorise different analog design styles according to their potential current …

The authors investigate testing of mixed signal integrated circuits. Several approaches are
proposed, most requiring careful partitioning of the analogue and digital sections. However …

This paper treats the problem of testing integrated operational amplifiers. The efficiency of a
new low-cost vector-less test solution, known as oscillation-test, is investigated. During the …

The increasing complexity of analogue/mixed-signal integrated circuits is leading test
engineers to propose self-test capabilities for these types of circuits. The use of on-chip …

In this paper, we propose a technique for on-chip analog output response compaction in
order to implement self-test capabilities in analog and mixed-signal integrated circuits. The …

This paper presents a built-in self-test (BIST) scheme for operational amplifier (Op Amp).
Without any parameters modification, the designed BIST system can be applied to test all the …

Power supply current monitoring is a promising technique for the development of new test
methodologies for analog and mixed-signal circuits. The advantages of efficiency and …

Single devices including both analog and digital functions are now a practical possibility, but
testing remains a problem and a bar to widespread use. Possible approaches to design …