Spectroscopic ellipsometry and FTIR characterization of annealed SiOxNy: H films prepared by PECVD

M Boulesbaa - Optical Materials, 2021 - Elsevier
We investigated the optical and the vibrational properties of amorphous SiO x N y: H thin
films deposited on silicon substrate using the plasma enhanced chemical vapor deposition …

Optimal design of quadruple-layer antireflection coating structure for conversion efficiency enhancement in crystalline silicon solar cells

WJ Zhang, DH Ma, ZQ Fan, XB Ma, Z Jiang - Optik, 2019 - Elsevier
In this paper, we employed a quadruple-layer antireflection coating structure with Al 2 O 3
deposited by DC reactive magnetron sputtering and SiO 2 deposited by PECVD (plasma …

Optimization of Silicon-Oxynitride Thin Films for Crystalline Silicon (c-Si) PERC Cell

HH Canar - 2022 - open.metu.edu.tr
PECVD deposited SiNx has been used in PV industry especially for PERC solar cell as anti-
reflection coating (ARC) and passivating layer [1]. However, its limited optical and electrical …

Examination of the Hydrogen Incorporation into Radio Frequency-Sputtered Hydrogenated SiNx Thin Films

N Hegedüs, R Lovics, M Serényi, Z Zolnai, P Petrik… - Coatings, 2021 - mdpi.com
In this work, amorphous hydrogen-free silicon nitride (a-SiNx) and amorphous hydrogenated
silicon nitride (a-SiNx: H) films were deposited by radio frequency (RF) sputtering applying …

Effect of rapid thermal annealing on the mechanical stress and physico-chemical properties in plasma enhanced atomic layer deposited silicon nitride thin films

AP Peter, A Sepulveda Marquez… - Journal of Vacuum …, 2022 - pubs.aip.org
The present study reports the impact of process conditions and post annealing treatment on
the stress and physico-chemical properties in different types of plasma enhanced atomic …

Development of Poly-SI/SIOx Passivating Contacts for Advanced SI Photovoltaics

MB Hartenstein - 2022 - search.proquest.com
As the Earth's population grows and nations become more developed the need for energy
continues to rise. The climate change brought about by warming temperatures from …

Classification of the Categories of Amorphous Hydrogenated Silicon Oxynitride Films Using Infrared Spectroscopy

M Boulesbaa, A Bouchekhlal - ICREEC 2019: Proceedings of the 1st …, 2020 - Springer
In this paper, a contribution to the classification of the various categories of amorphous
hydrogenated silicon oxynitride films using infrared spectroscopy has been carried out. A …

[PDF][PDF] Rádiófrekvenciás porlasztással előállított szilícium és szilíciumnitrid vékonyrétegek vizsgálata

H Nikolett - lib.uni-obuda.hu
Köszönöm Dr. Serényi Miklósnak, hogy bevezetett az RF porlasztás rejtelmeibe, és hasznos
ötleteivel, tanácsaival folyamatosan segítette munkámat. Köszönettel tartozom Dr. Lovics …