Recent interest in high-speed scanning probe microscopy for high-throughput applications
including video-rate atomic force microscopy and probe-based nanofabrication has sparked …

The ability to tailor the chemical composition and structure of a surface at the sub-100-nm
length scale is important for studying topics ranging from molecular electronics to materials …

Nanotechnology is the science of understanding matter and the control of matter at
dimensions of 100 nm or less. Encompassing nanoscale science, engineering, and …

A new mechanical scanner design for a high-speed atomic force microscope (AFM) is
presented and discussed in terms of modeling and control. The positioning range of this …

Nanopores embedded in two-dimensional (2D) nanomaterials are a promising emerging
technology for osmotic power generation. Here, coupling our new AFM-based pore …

Abrasive wear of sharp silicon tips sliding distances of up to 750 m on a polymeric surface is
studied using atomic force microscopy. The data cannot be explained by conventional …

Using photolithographic techniques,[13] we have fabricated a 55000-pen 2D array (yield>
98%; Figure 1A). With a pen spacing of 90 and 20 μm in the x and y directions, respectively …

The Atomic Force Microscope (AFM) is one of the most versatile tools in nanotechnology.
For control engineers this instrument is particularly interesting, since its ability to image the …

A novel scan trajectory for high-speed scanning probe microscopy is presented in which the
probe follows a two-dimensional Lissajous pattern. The Lissajous pattern is generated by …

A novel design of a scanning unit for atomic force microscopy (AFM) is presented that
enables scanning speeds three orders of magnitude faster than compared to conventional …