The use of artificial intelligence (AI) approaches, one of the most significant technological
advances of the 21st century, to determine the diode parameters that can be obtained from …

In this chapter, the thermal transient measurements of the most important device categories
are discussed. In each section, one specific device type is discussed, taking into …

The chapter aims at explaining the physical background of the operation of semiconductor
devices. It outlines what equations govern the currents and voltages in them and how the …

After a brief introduction to the concept of measurement uncertainty, the chapter presents the
major factors that typically contribute to it. The major terms used in the characterization of the …

As described in Chap. 2, measuring the Z th thermal impedance of a packaged
semiconductor chip provides all thermal information that is theoretically available. In daily …

This chapter demonstrates the variable use potential of thermal transient testing. For thermal
qualification and structure identification, usually the TDIM method is used, so the chapter …

The measurement of physical quantities always needs a solid background in physics. For
measuring the thermal parameters of a device under test (DUT), a thermal model of the DUT …