Design tradeoffs and challenges in practical coherent optical transceiver implementations

DA Morero, MA Castrillón, A Aguirre… - Journal of Lightwave …, 2016 - opg.optica.org
This tutorial discusses the design and ASIC implementation of coherent optical transceivers.
Algorithmic and architectural options and tradeoffs between performance and …

Dynamic optimality—almost

ED Demaine, D Harmon, J Iacono… - SIAM Journal on …, 2007 - SIAM
We present an O(\lg\lgn)-competitive online binary search tree, improving upon the best
previous (trivial) competitive ratio of O(\lgn). This is the first major progress on Sleator and …

A distributed cache for hadoop distributed file system in real-time cloud services

J Zhang, G Wu, X Hu, X Wu - 2012 ACM/IEEE 13th …, 2012 - ieeexplore.ieee.org
The improvement of file access performance is a great challenge in real-time cloud services.
In this paper, we analyze preconditions of dealing with this problem considering the aspects …

Self-test and diagnosis for self-aware systems

MA Kochte, HJ Wunderlich - IEEE Design & Test, 2017 - ieeexplore.ieee.org
Self-testing hardware has a long tradition as a complement to manufacturing testing based
on test stimuli and response analysis. Today, it is a mature field and many complex SoCs …

Low-power programmable PRPG with test compression capabilities

M Filipek, G Mrugalski, N Mukherjee… - … Transactions on Very …, 2014 - ieeexplore.ieee.org
This paper describes a low-power (LP) programmable generator capable of producing
pseudorandom test patterns with desired toggling levels and enhanced fault coverage …

Trimodal scan-based test paradigm

G Mrugalski, J Rajski, J Solecki… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
This paper presents a novel scan-based design for test (DFT) paradigm. Compared with
conventional scan, the presented approach either significantly reduces test application time …

Dstress: Automatic synthesis of dram reliability stress viruses using genetic algorithms

L Mukhanov, DS Nikolopoulos… - 2020 53rd Annual …, 2020 - ieeexplore.ieee.org
Failures become inevitable in DRAM devices, which is a major obstacle for scaling down the
density of cells in future DRAM technologies. These failures can be detected by specific …

Test generator with preselected toggling for low power built-in self-test

J Rajski, J Tyszer, G Mrugalski… - 2012 IEEE 30th VLSI …, 2012 - ieeexplore.ieee.org
This paper presents a new pseudorandom test pattern generator with preselected toggling
(PRESTO) activity. It is comprised of a linear finite state machine (a linear feedback shift …

Deterministic clustering of incompatible test cubes for higher power-aware EDT compression

D Czysz, G Mrugalski, N Mukherjee… - … on Computer-Aided …, 2011 - ieeexplore.ieee.org
The embedded deterministic test-based compression uses cube merging to reduce a pattern
count, the amount of test data, and test time. It gradually expands a test pattern by …

A Survey and Recent Advances: Machine Intelligence in Electronic Testing

S Roy, SK Millican, VD Agrawal - Journal of Electronic Testing, 2024 - Springer
Integrated circuit (IC) testing presents complex problems that for large circuits are
exceptionally difficult to solve by traditional computing techniques. To deal with …