We present an O(\lg\lgn)-competitive online binary search tree, improving upon the best previous (trivial) competitive ratio of O(\lgn). This is the first major progress on Sleator and …
J Zhang, G Wu, X Hu, X Wu - 2012 ACM/IEEE 13th …, 2012 - ieeexplore.ieee.org
The improvement of file access performance is a great challenge in real-time cloud services. In this paper, we analyze preconditions of dealing with this problem considering the aspects …
Self-testing hardware has a long tradition as a complement to manufacturing testing based on test stimuli and response analysis. Today, it is a mature field and many complex SoCs …
M Filipek, G Mrugalski, N Mukherjee… - … Transactions on Very …, 2014 - ieeexplore.ieee.org
This paper describes a low-power (LP) programmable generator capable of producing pseudorandom test patterns with desired toggling levels and enhanced fault coverage …
This paper presents a novel scan-based design for test (DFT) paradigm. Compared with conventional scan, the presented approach either significantly reduces test application time …
Failures become inevitable in DRAM devices, which is a major obstacle for scaling down the density of cells in future DRAM technologies. These failures can be detected by specific …
This paper presents a new pseudorandom test pattern generator with preselected toggling (PRESTO) activity. It is comprised of a linear finite state machine (a linear feedback shift …
The embedded deterministic test-based compression uses cube merging to reduce a pattern count, the amount of test data, and test time. It gradually expands a test pattern by …
Integrated circuit (IC) testing presents complex problems that for large circuits are exceptionally difficult to solve by traditional computing techniques. To deal with …