Influence of cavity length and emission wavelength on the characteristic temperature in AlGaAs lasers

M Sánchez, P Díaz, G Torres… - Journal of applied physics, 1995 - pubs.aip.org
The dependence of the characteristic temperature T 0 on the cavity length and lasing
wavelength is theoretical and experimentally analyzed. The devices are straight separate …

Thermal resistance of double heterostructure separate confinement GaAs\,/AlGaAs semiconductor lasers in stripe geometry configuration

E Marin, I Camps, M Sanchez, P Diaz - Revista Mexicana de Fisica, 1995 - rmf.smf.mx
The behavior of a laser diode is affeeted by an inerease of temperatnre within its volume
during operation, whieh is determined by the value of the thermal resistan ce of the device …

Low‐temperature LPE technique for the performance of visible AlGaAs (SC) lasers

P Díaz, TA Prutskij, F López - Crystal Research and Technology, 1990 - Wiley Online Library
The possibilities of the low‐temperature (LT)‐LPE technique in the performance of visible
AlGaAs laser diodes are studied. Low current density visible lasers λ˜ 746 nm has been …

Investigation of LPE Ga1− xAlxAs/GaAs laser structures by double crystal diffractometry

C Bocchi, C Ferrari, P Franzosi, M Scaffardi… - Journal of crystal …, 1991 - Elsevier
The possibility of characterizing Ga 1− x Al x As/GaAs laser structures, with both a single and
double confinement, using the double crystal X-ray diffractometry has been investigated …

Determinacion de Espesores de Capas Nonometricas en Heteroestructuras de GaAs-AlxGa1-xAs Mediante SEM

T Prutskij, R Silva, F Chávez… - Revista Mexicana de …, 1994 - rmf.smf.mx
Se reportan los resultados de la observación directa mediante microscopía electrónica de
barrido (SEM) de los espesores de capas nanométricas en heteroestructuras multicapas de …

[引用][C] Thermal resistance of double heterostructure separate confinement GaAs/AIGaAs semiconductor lasers in stripe geometry configuration

TROFD HETEROSTRUCTURE

[引用][C] Cavidades ópticas con perfil recto y parabólico del índice de refracción en láseres de AlGaAs e InGaN

JAM Alfonso, MS Colina, FG Reina - 2007 - Editorial Universitaria

[引用][C] T. PRUTSKIJ Centro de Investigación en Dispositivos Semiconductores, IC-BUAP Apartado postal 1651, 72000 Puebla, Pue., México R. SILVA Instituto de …

FCYF SILVA-ANDRADE - Revista mexicana de física, 1995 - Sociedad Mexicana de Física