TIMBER: Time borrowing and error relaying for online timing error resilience

M Choudhury, V Chandra… - … Design, Automation & …, 2010 - ieeexplore.ieee.org
Increasing dynamic variability with technology scaling has made it essential to incorporate
large design-time timing margins to ensure yield and reliable operation. Online techniques …

Time-borrowing circuit designs and hardware prototyping for timing error resilience

MR Choudhury, V Chandra, RC Aitken… - IEEE transactions on …, 2012 - ieeexplore.ieee.org
As dynamic variability increases with CMOS scaling, it is essential to incorporate large
design-time timing margins to ensure yield and reliable operation. Online techniques for …

Recent subthreshold design techniques

M Radfar, K Shah, J Singh - Active and Passive Electronic …, 2012 - Wiley Online Library
Considering the variety of studies that have been reported in low‐power designing era, the
subthreshold design trend in Very Large Scale Integrated (VLSI) circuits has experienced a …

Near-threshold-voltage circuit design: The design challenges and chances

IC Wey, PJ Lin, BC Wu, CC Peng… - 2014 International SoC …, 2014 - ieeexplore.ieee.org
NTV is a new low power design concept for the pursuit of the highest power usage
efficiency. The characteristics for each logic family are quite different under NTV while …

Optimizing the power-delay product of a linear pipeline by opportunistic time borrowing

M Ghasemazar, M Pedram - IEEE Transactions on Computer …, 2011 - ieeexplore.ieee.org
In this paper, we present and solve the problem of power-delay optimal soft linear pipeline
design. The key idea is to use soft-edge flip-flops to allow time borrowing among …

Minimizing the energy cost of throughput in a linear pipeline by opportunistic time borrowing

M Ghasemazar, M Pedram - 2008 IEEE/ACM International …, 2008 - ieeexplore.ieee.org
In this paper, we present a technique to optimize the energy-delay product of a synchronous
linear pipeline circuit with dynamic error detection and correction capability running. The …

Using soft-edge flip-flops to compensate NBTI-induced delay degradation

K Duraisami, E Macii, M Poncino - Proceedings of the 19th ACM Great …, 2009 - dl.acm.org
We present a low-overhead solution to tackle the delay increase caused by Negative Bias
Temperature Instability (NBTI), which has emerged as the most critical reliability issue in sub …

[图书][B] Approximate logic circuits: Theory and applications

M Choudhury - 2011 - search.proquest.com
CMOS technology scaling, the process of shrinking transistor dimensions based on Moore's
law, has been the thrust behind increasingly powerful integrated circuits for over half a …

[PDF][PDF] Τεχνικές ανίχνευσης και διόρθωσης λαθών χρονισμού για αυξημένη αξιοπιστία ολοκληρωμένων κυκλωμάτων σε νανομετρικές τεχνολογίες

Σ Βαλαδήμας - 2016 - core.ac.uk
As technology scales down, timing errors are a real concern in high complexity and high
frequency integrated circuits. Process, Voltage and Temperature variations lead to large …

Method to address performance decline due to process, voltage, and temperature variations in integrated circuits

M Radfar - 2013 - opal.latrobe.edu.au
Design of high-performance processors has undergone a drastic change since the start of
the new millennium due to power consumption related difficulties, such as heat dissipation …