The crystal structure of the semiconductor compound CuFe2InSe4 was analyzed using X-
ray powder diffraction data. The powder pattern refined by the Rietveld method was …

The structural, electronic, and magnetic properties I–II 2–III–VI 4 and I 2–II–IV–VI 4 are
investigated firstly by using the first-principles calculations. The investigation was done …

The crystal structure of the adamantane compound CuFeInSe3, belonging to the system
(CuInSe2) 1–x (FeSe) x with x= 0.5, was analyzed using X‐ray powder diffraction data …

The crystal structure of the quaternary compounds CuFe 2 AlSe 4 and CuFe 2 GaSe 4,
belonging to the system I–II 2–III–VI 4, were characterized using X-ray powder diffraction …

Polycrystalline samples of the (CuInSe 2) 1− x (FeSe) x alloy system in the composition
range 0⩽ x⩽ 1 were prepared by the melt and anneal technique. X-ray Diffraction (XRD) and …

The crystal structure of the quaternary compound AgFe 2 GaTe 4, belonging to the system I–
II 2–III–VI 4, was characterized by Rietveld refinement using X-ray powder diffraction data …

Samples of the quaternary chalcogenide compounds, CuNiGaSe 3 and CuNiInSe 3,
prepared by direct fusion and annealing method, were characterized by X-ray powder …

The crystal structure of the chalcogenide compounds CuCo2InTe4 and CuNi2InTe4, two
new members of the I-II2-III-VI4 family, were characterized by Rietveld refinement using X …

The crystal structure of the chalcogenide compounds CuFeAlSe3 and CuFeGaSe3,
belonging to the system I‐II‐III‐III3, were characterized using X‐ray powder diffraction data …

The crystal structure of the new quaternary compound CuTa2InTe4 was studied using X-ray
powder diffraction data. The powder pattern refined by the Rietveld method indicates that …