Workpiece inspection device and workpiece inspection method
R Obara, M Isokawa, Y Saito, M Yamamoto… - US Patent …, 2023 - Google Patents
A workpiece inspection device 1 includes a table (3), image capturing unit fixing part (7), first
light projection unit (4), second light projection unit (5), linear movement mechanism (8) …
light projection unit (4), second light projection unit (5), linear movement mechanism (8) …
Surface inspection apparatus, non-transitory computer readable medium storing program, and surface inspection method
T Hiramatsu, K Tasaki, K Aikawa, M Uno… - US Patent …, 2023 - Google Patents
The disclosure provides a surface inspection apparatus for inspecting a surface of an object,
a non-transitory computer readable medium thereof, and a surface inspection method …
a non-transitory computer readable medium thereof, and a surface inspection method …
Abnormality detection device, abnormality detection computer program product, and abnormality detection system
TVT Duy, N Natori - US Patent 12,051,184, 2024 - Google Patents
An abnormality detection device includes an acquisition process unit that acquires plural
captured images captured by an imaging device to image an object in different positions or …
captured images captured by an imaging device to image an object in different positions or …
Method for the analysis of surface measurements
T Chudoba - US Patent 10,748,275, 2020 - Google Patents
A method for the analysis of surface measurements, in particular scratch tests, wear tests or
profilometric measurements, wherein a graph with displayable curves in the form of …
profilometric measurements, wherein a graph with displayable curves in the form of …