Cuprous iodide–ap‐type transparent semiconductor: History and novel applications

M Grundmann, FL Schein, M Lorenz… - … status solidi (a), 2013 - Wiley Online Library
Halide semiconductors stand at the very beginning of semiconductor science and
technology. CuI was reported as the first transparent conductor, and the first field effect …

Chloride-based CVD growth of silicon carbide for electronic applications

H Pedersen, S Leone, O Kordina, A Henry… - Chemical …, 2012 - ACS Publications
Silicon carbide (SiC) is a fascinating material. In one way, it is very simple; there are only two
atoms building up the crystal—silicon and carbon, where each atom is sp3-hybridized and …

CFD simulation of CVD reactors in the CH3SiCl3 (MTS)/H2 system using a two-step MTS decomposition and one-step SiC growth models

T Ogawa, K Fukumoto, H Machida, K Norinaga - Heliyon, 2023 - cell.com
In this study, we report on a computational fluid dynamics (CFD) simulation of the chemical
vapor deposition reactor of silicon carbide (SiC) in the methyltrichlorosilane (MTS, CH 3 SiCl …

Growth of 4H-SiC epitaxial layers at temperatures below 1500° C using trichlorosilane (TCS)

S Yang, S Zhao, J Chen, G Yan, Z Shen, W Zhao… - Journal of Crystal …, 2023 - Elsevier
TCS (SiHCl 3) is widely used in the rapid growth of SiC. However, in the study of using TCS
to grow 4H-SiC, the growth temperature is mainly concentrated in 1550–1650° C, and the …

Improved morphology for epitaxial growth on 4 off-axis 4H-SiC substrates

S Leone, H Pedersen, A Henry, O Kordina… - Journal of Crystal …, 2009 - Elsevier
A process optimization of the growth of silicon carbide (SiC) epilayers on 4° off-axis 4H-SiC
substrates is reported. Process parameters such as growth temperature, C/Si ratio and …

Thick homoepitaxial layers grown on on-axis Si-face 6H-and 4H-SiC substrates with HCl addition

S Leone, H Pedersen, A Henry, O Kordina… - Journal of crystal …, 2009 - Elsevier
The homoepitaxial growth of 6H-and 4H-SiC on on-axis substrates has been studied in
order to demonstrate the growth of thick, mirror-like epitaxial layers without other polytype …

Advances in fast 4H–SiC crystal growth and defect reduction by high-temperature gas-source method

H Tsuchida, T Kanda - Materials Science in Semiconductor Processing, 2024 - Elsevier
This paper reviews recent progress in the development of high-speed 4H–SiC bulk crystal
growth technology using the high-temperature gas-source method (high-temperature …

Reduction of structural defects in thick 4H-SiC epitaxial layers grown on 4° off-axis substrates

M Yazdanfar, IG Ivanov, H Pedersen… - Journal of Applied …, 2013 - pubs.aip.org
Reduction of structural defects in thick 4H-SiC epitaxial layers grown on 4 off-axis substrates |
Journal of Applied Physics | AIP Publishing Skip to Main Content Umbrella Alt Text Umbrella Alt …

Gas-phase modeling of chlorine-based chemical vapor deposition of silicon carbide

S Leone, O Kordina, A Henry, S Nishizawa… - Crystal growth & …, 2012 - ACS Publications
Kinetic calculations of the chemical phenomena occurring in the epitaxial growth of silicon
carbide are performed in this study. The main process parameters analyzed are precursor …

Investigating routes toward atomic layer deposition of silicon carbide: Ab initio screening of potential silicon and carbon precursors

EA Filatova, D Hausmann, SD Elliott - Journal of Vacuum Science & …, 2017 - pubs.aip.org
Silicon carbide (SiC) is a promising material for electronics due to its hardness, and ability to
carry high currents and high operating temperature. SiC films are currently deposited using …