Deep learning tasks cover a broad range of domains and an even more extensive range of
applications, from entertainment to extremely safety-critical fields. Thus, Deep Neural …

Technological scaling has increased the susceptibility of logic circuits to radiation-induced
transient faults, making digital devices less reliable. Although different techniques have …

Abstract Systems and methods for implementing a lightweight checkpoint technique for
resilience against soft errors are disclosed. The technique provides effective, safe, and …

Abstract All-Programmable System-on-Chips (APSoCs) constitute a compelling option for
employing applications in radiation environments thanks to their high-performance …

Silent data corruption (SDC) is the most insidious and harmful result type of soft error.
Identify program vulnerable instructions (PVIns) that are likely to cause SDCs is extremely …

Software-based techniques offer several advantages to increase the reliability of processor-
based systems at very low cost, but they cause performance degradation and an increase of …

Soft errors are considered as the main reliability challenge for sub-nanoscale
microprocessors. Software-level soft error resilience schemes are desirable because they …

Abstract Silent Data Corruptions (SDCs) is a serious reliability issue in many domains of
computer system. The identification and protection of the program instructions that cause …

A method is presented for automated improvement of embedded application reliability. The
compilation process is guided using genetic algorithms and a multiobjective optimization …

With continuously shrinking semiconductor structure sizes and lower supply voltages, the
per-device susceptibility to transient and permanent hardware faults is on the rise. A class of …