High-Accuracy Calibration for a Multiview Microscopic 3-D Measurement System

Self-Correcting and Globally-Consistent 3D Cross-Ratio Invariant Model for Multi-View Microscopic Profilometry

R Dai, X Tang, W Li, YH Liu - IEEE Transactions on Industrial …, 2024 - ieeexplore.ieee.org
This article introduces a multiview 3-D microscopic profilometry system equipped with tilted
cameras adhering to the Scheimpflug condition and a vertically aligned projector. It utilizes a …
相关文章