Fanout-Based Reliability Model for SER Estimation in Combinational Circuits
E Esmaieli, Y Sedaghat… - IEEE Transactions on …, 2024 - ieeexplore.ieee.org
Soft errors in Integrated Circuits (ICs) have always been a major concern, particularly as
CMOS technology nodes continue to shrink, resulting in higher frequency, lower power, and …
CMOS technology nodes continue to shrink, resulting in higher frequency, lower power, and …
Deep Neural Network-Based Accelerators for Repetitive Boolean Logic Evaluation
D Senarathna, S Tragoudas - 2023 IEEE 36th International …, 2023 - ieeexplore.ieee.org
This paper shows the learnability of complex Boolean Logic functions by Deep Neural
Networks (DNNs) and the ability to accelerate logic evaluation using DNNs while ensuring …
Networks (DNNs) and the ability to accelerate logic evaluation using DNNs while ensuring …