Due to the continuously shrinking device structures and increasing densities of FPGAs,
thermal aspects have become the new focus for many research projects over the last years …

This work demonstrates a novel method of accelerating FPGA aging by configuring FPGAs
to implement thousands of short circuits, resulting in high on-chip currents and temperatures …

Due to the aggressive scaling of process technologies, ultra-logic densities on integrated
circuits, and also the complexity of designs, which in turn lead to a drastic increase of power …

Runtime variability sources, such as bias temperature instability (BTI) and supply voltage
fluctuation affect both timing and functionality of the flip-flops inside a VLSI circuit. In this …

Autonomous mobile systems nowadays deploy FPGA‐based System on Programmable
Chips (SoPCs) for supporting their dynamic multitask multimodal workloads. For such field …

Run-time TID test in SRAM based FPGAs can improve reliability in space applications, but
none feasible approach has been presented. This paper proposes a lightweight built-in test …

The purpose of the thesis is to explore and investigate Linux container's ability to allow for
quick scaling of web services. This is important for many web service providers, because …

VLSI circuits are influenced by several sources of process and runtime variabilities [16].
Among them, supply voltage fluctuation and transistor aging due to BTI are the most …

Embedded Systems (ES) underlie society's critical cyberinfrastructure and comprise the vast
majority of consumer electronics, making them a prized target for dangerous malware and …

Modern electronic devices are an indispensable part of our everyday life. A major enabler
for such integration is the exponential increase of the computation capabilities as well as the …