Semiconductor scaling causes increasing and unavoidable within-die parametric variability.
This paper describes accurate measurement techniques for characterising both systematic …

An Internet cyber threat monitoring system detects cyber threats using network sensors
deployed at particular points on the Internet, statistically analyzes the time of attack, source …

We present the first delay-fault testing approach for Field Programmable Gate Arrays
(FPGAs), applicable for on-line testing as well as for off-line manufacturing and system-level …

Testing techniques for interconnect and logic resources of an arbitrary design implemented
into a field-programmable gate array (FPGA) are presented. The target fault list includes all …

As IC densities are increasing, cluster-based field programmable gate arrays (FPGA)
architectures are becoming the architecture of choice for major FPGA manufacturers. A …

Although dynamic voltage scaling (DVS) is a popular power reduction solution that has been
widely used by processors and ASICs, it is still not commercially adopted by FPGAs. A …

The interconnection network consumes the majority of die area in an FPGA. Presented is a
scalable manufacturing test method for all SRAM-based FPGAs, able to detect multiple …

Dynamic voltage scaling (DVS) is one of the most effective ways to reduce integrated circuit
power. However, the programmability of field programmable gate arrays (FPGAs) means …

Variations in the semiconductor fabrication process results in variability in parameters
between transistors on the same die, a problem exacerbated by lithographic scaling. The re …

Due to the increased use of field-programmable gate arrays (FPGAs) in production circuits
with high reliability requirements, the design-specific testing of FPGAs has become an …