[HTML][HTML] Microstructure evolution at the interface between Cu and eutectic Sn–Bi alloy with the addition of Ag or Ni

O Minho, Y Tanaka, E Kobayashi - Journal of Materials Research and …, 2023 - Elsevier
The study investigated the growth kinetics and rate-controlling processes of intermetallic
layers formed at the interface between Cu and eutectic Sn–Bi alloys with Ag or Ni addition at …

Growth behavior of intermetallic layers at the interface between Cu and eutectic Sn–Bi by grain boundary diffusion with the grain growth at solid-state temperatures

O Minho, Y Tanaka, E Kobayashi - Intermetallics, 2023 - Elsevier
The growth kinetics and rate-controlling processes of intermetallic layers formed in Cu/(Sn-
58 wt% Bi) diffusion couples were investigated. Isothermal annealing of diffusion couples …

Investigation of the rate-controlling process of intermetallic layer growth at the interface between ferrous metal and molten Al–Mg–Si alloy

O Minho, K Sato, E Kobayashi - Intermetallics, 2023 - Elsevier
In this study, we focused on unraveling the intricate world of intermetallic compound
formation at the interface of solid Fe and liquid Al–Mg–Si alloy. Our primary aim was to shed …

[HTML][HTML] Influence of carbon nanotubes on the morphology of Cu6Sn5 in Cu/(Sn–Ag–Cu) solder joints

M Oh, H Iwamoto, E Kobayashi - Results in Materials, 2024 - Elsevier
This study delves into the intricate interaction between multi-walled carbon nanotubes
(MWCNTs) and the Sn–Ag–Cu solder system, highlighting its relevance in lead-free …

[HTML][HTML] Understanding Kirkendall effect in Ni (W) diffusion-induced recrystallization region

M Oh, HS Kim, E Kobayashi, M Kajihara - Journal of Alloys and Compounds, 2024 - Elsevier
This study elucidates the formation of distinct phases, such as intermetallic compounds
(IMCs), and the evolution of Kirkendall voids. We not only observed the emergence of …

Rate-controlling process of compound growth in Cu-Clad Al wire during isothermal annealing at 483–543 K

T Kizaki, M Kajihara - Materials Transactions, 2020 - jstage.jst.go.jp
The rate-controlling process of compound growth in the Cu-clad Al (CA) wire was
metallographically examined in the temperature range of 483–543 K (210–270 C). CA wires …

Recent development of joining and conductive materials for electronic components

T Kobayashi, T Ando - Materials transactions, 2021 - jstage.jst.go.jp
This study introduces research trends in the electronics materials, such as joining materials
including high-temperature lead-free solder, sintered materials using metal particles and …

Thermal and stress impacts on vacancy diffusion through atomistic simulations

B Dong, Y Fu, H Zhan, C Lü - International Journal of Mechanical Sciences, 2023 - Elsevier
Vacancy diffusion is involved in a variety of destructive failure processes in metals, whose
impact becomes more magnificent in real engineering applications with external thermal …

Thermodynamics and kinetics of interdiffusion in Ni//NiAl diffusion couples

X Gao, S Martin, X Wen, Y Tian, B Zhang… - Journal of Alloys and …, 2024 - Elsevier
The growth behavior of Ni 3 Al after nucleation at the Ni/NiAl interface was investigated by
using macroscopic diffusion couples at low annealing temperatures of 973–1073 K. The …

The coupling effects of temperature and stress on the growth kinetics of Ni3Al in Ni//NiAl diffusion couples

X Gao, Y Tian, X Wen, B Zhang, Y Wang… - Surface and Coatings …, 2024 - Elsevier
The growth kinetics of Ni 3 Al were investigated in Ni//NiAl macroscopic diffusion couples
annealed at 800–1000° C under applied elastic compressive stress. By utilizing electron …