Methodology of an Accurate Static I–V Characterization of Power Semiconductor Devices
Static I-Vcharacterization (SIVC) is extensively used by the researchers for evaluating the
ON-state performance and real-time condition monitoring of the power semiconductor …
ON-state performance and real-time condition monitoring of the power semiconductor …
Failure mechanisms implementation into SiGe HBT compact model operating close to safe operating area edges
M Couret - 2020 - theses.hal.science
In an ever-growing terahertz market, BiCMOS technologies have reached cut-off frequencies
beyond 0.5 THz. These dynamic performances are achieved thanks to the current …
beyond 0.5 THz. These dynamic performances are achieved thanks to the current …
[PDF][PDF] DOCTEUR DE L'UNIVERSITÉ DE BORDEAUX
C DUMORTIER - 2020 - academia.edu
Résumé Dans sa course contre le réchauffement climatique, l'humanité commence à
développer des solutions de mobilité alternative. Cependant, la mise au point de systèmes …
développer des solutions de mobilité alternative. Cependant, la mise au point de systèmes …