Advanced methodology for fast 3-D TCAD device/circuit electrothermal simulation and analysis of power HEMTs

A Chvála, D Donoval, A Šatka, M Molnár… - … on Electron Devices, 2015 - ieeexplore.ieee.org
This paper introduces an advanced methodology for fast 3-D Technology Computer Aided
Design (TCAD) electrothermal simulation for the analysis of power devices. The proposed …

Effective and reliable heat management for power devices exposed to cyclic short overload pulses

M Nelhiebel, R Illing, T Detzel, S Wöhlert, B Auer… - Microelectronics …, 2013 - Elsevier
Electric overload situations in automotive truck applications necessitate a particularly
efficient and reliable heat management for silicon power devices, especially when repetitive …

Damage evolution during cyclic tension–tension loading of micron-sized Cu lines

A Wimmer, A Leitner, T Detzel, W Robl, W Heinz… - Acta Materialia, 2014 - Elsevier
In this study, the low-cycle fatigue properties (1–15,000 cycles) of electrodeposited Cu,
which is frequently used as metallization in the semiconductor industry, is analyzed with …

Fast 3-D electrothermal device/circuit simulation of power superjunction MOSFET based on SDevice and HSPICE interaction

A Chvála, D Donoval, J Marek… - … on Electron Devices, 2014 - ieeexplore.ieee.org
Automated interaction of SDevice and HSPICE for fast 3-D electrothermal simulation based
on the relaxation method is designed. The results are compared with device finite element …

Behavioral electrothermal modeling of MOSFET for energy conversion circuits simulation using MATLAB/Simulink

M Baghdadi, E Elwarraki, IA Ayad, N Mijlad - Microelectronics Reliability, 2024 - Elsevier
The development of accurate and efficient electrothermal models and simulations for power
electronics semiconductors is essential to optimize power electronics circuits and systems …

FEM simulation approach to investigate electro-thermal behavior of power transistors in 3-D

V Košel, S de Filippis, L Chen, S Decker… - Microelectronics …, 2013 - Elsevier
A simulation approach is presented which can be used to investigate electro-thermal
behavior of power transistors in variety of operating conditions. The approach is discussed …

Modeling of highly anisotropic microstructures for electro-thermal simulations of power semiconductor devices

S de Filippis, H Köck, M Nelhiebel, V Košel… - Microelectronics …, 2012 - Elsevier
When performing electro-thermal simulations of power semiconductors, usually the FEM
model of the device does not include small geometrical features in order to limit the …

[PDF][PDF] Modeling and simulation of fatigue damage in power semiconductors

M Springer - 2017 - researchgate.net
One of the main design challenges for modern power semiconductor devices is the
reduction of the device footprint while maintaining or even increasing the power density …

Electrothermal multiscale modeling and simulation concepts for power electronics

H Köck, S Eiser, M Kaltenbacher - IEEE Transactions on Power …, 2015 - ieeexplore.ieee.org
This paper presents a finite-element-based simulation methodology to improve on
multiscale modeling and analysis limitations of power electronics development. The method …

Influence Analysis of Back-Barrier and AIN Substrate on the High-Temperature Performance of an E-Mode Mg-Doped In0.2Ga0.8N Capped Gate High Electron …

YU Tarauni, DJ Thiruvadigal, M Hotoro, FS Koki… - Journal of Electronic …, 2022 - Springer
This work presents an investigation of the performance assessment of E-mode Mg-doped
In0. 2Ga0. 8N/Al0. 23Ga0. 77N/GaN/Al0. 05Ga0. 95N on AIN substrate use for high-power …