Enhanced artificial intelligence technique for soft fault localization and identification in complex aircraft microgrids
In recent years, the aviation industry has witnessed a substantial integration of power
electronics technology within Aircraft Microgrids (AMs). Consequently, the extension of …
electronics technology within Aircraft Microgrids (AMs). Consequently, the extension of …
Simulation-to-reality based transfer learning for the failure analysis of SiC power transistors
Failure analysis is essential for improving the reliability and manufacturability of electronic
devices. With the time-domain reflectometry method, failures can be analyzed non …
devices. With the time-domain reflectometry method, failures can be analyzed non …
Wiring networks diagnosis using K-Nearest neighbour classifier and dynamic time warping
In this study, an effective diagnostic method for wiring networks based on reflectometry
technique, the K-Nearest Neighbour (KNN) classifier, and Dynamic Time Warping (DTW) …
technique, the K-Nearest Neighbour (KNN) classifier, and Dynamic Time Warping (DTW) …
Enhanced complex wire fault diagnosis via integration of time domain reflectometry and particle swarm optimization with least square support vector machine
Urban power systems rely on intricate wire networks, known as the power grid, which form
the essential electric infrastructure in cities. While these networks transmit electricity from …
the essential electric infrastructure in cities. While these networks transmit electricity from …
A novel deep convolutional neural network and its application to fault diagnosis of the squirrel-cage asynchronous motor under noisy environment
L Chen, Y Ma, H Wang, S Wen… - … Science and Technology, 2023 - iopscience.iop.org
The intelligent classification achieved through the utilization of deep learning networks,
which possess the capability to automatically extract essential features from data, has …
which possess the capability to automatically extract essential features from data, has …
Hybrid Modelling for the Failure Analysis of SiC Power Transistors on Time-Domain Reflectometry Data
Ensuring and improving the reliability of electronic devices requires post-production failure
analysis processes. One of the techniques to perform failure analysis for electronic devices …
analysis processes. One of the techniques to perform failure analysis for electronic devices …