Topological global routing for automated IC package interconnect

K Wadland, G Kingsbury - US Patent 7,017,137, 2006 - Google Patents
An automated method and System is disclosed to determine an Integrated Circuit (IC)
package interconnect routing using a mathematical topological Solution. A global topo …

Method and system for optimized automated IC package pin routing

K Wadland, J Morrison, J Blumenthal - US Patent 7,594,215, 2009 - Google Patents
BACKGROUND As designers strive to improve the capabilities of new ICs, minimization of
circuit size continues to be an underlying goal. Recent developments in IC design have …

Вычисление минимального по длине пути проводника в топологической трассировке печатного монтажа

ЮИ Попов, СИ Попов - Научно-технический вестник …, 2012 - cyberleninka.ru
В топологическом подходе к трассировке печатных плат возникает задача вычисления
пути (формы) проводника по его топологическому пути. Предложен алгоритм …

A new routing design methodology for multi-chip IC packages

H Murata - The 2004 47th Midwest Symposium on Circuits and …, 2004 - ieeexplore.ieee.org
This paper presents a new methodology for routing design in multi-chip IC packages for
reducing design time while attaining a layer efficiency comparable to hand crafted design. In …

Calculation of the Minimum Path Length Wire in the Printed Wiring Topological Routing

Y Popov, S Popov - Journal Scientific and Technical Of Information …, 2012 - ntv.ifmo.ru
There is a problem to calculate the path (shape) of a wire by its topological path in the
topological approach to the wire routing. An algorithm which calculates the minimum length …

Timing preservation in wire spreading utilized for yield improvement

T Serdar, O Omedes… - 2006 IEEE International …, 2006 - ieeexplore.ieee.org
Today's submicron technologies increase the IC sensitivity to the physical manufacturing
defects, which results in poor initial product yield. It is well known that IC layout can be made …

A new sensitivity model with blank space for layout optimization

J Wang, Y Wu, S Liu, R Xing - Journal of Semiconductors, 2017 - iopscience.iop.org
As the technology scales advancing into the nanometer region, the concept of yield has
become an increasingly important design metric. To reduce the yield loss caused by local …

A robust and correct computation for the curvilinear routing problem

T Yan, H Murata - … Symposium on Circuits and Systems (ISCAS …, 2005 - ieeexplore.ieee.org
Curvilinear routing has been a long standing problem in layout design. Several algorithms
have been proposed based on real numbers but none of them considers the numerical error …