X-ray photoelectron spectroscopy (XPS) is a powerful tool to study surface properties (< 10
nm) and is being widely used in almost all branches of science and engineering. This review …

The use of peak fitting to extract information from x-ray photoelectron spectroscopy (XPS)
data is of growing use and importance. Due to increased instrument accessibility and …

ABSTRACT X-ray photoelectron spectroscopy (XPS) is widely used to identify chemical
species at a surface through the observation of peak positions and peak shapes. It is less …

Core X‐ray photoelectron spectroscopic (XPS) data often contain overlapping chemically
shifted peaks that differ in their width, peak shape, and intensity. The spectra may be …

The photoemission spectra of Cu 2p are one of the most studied. Its analysis is especially
challenging because, among others, the peaks for Cu 0 and Cu 1+ overlap, and Cu 1+ and …

Assessment of the frequency and nature of erroneous x-ray photoelectron spectroscopy
analyses in the scientific literature | Journal of Vacuum Science & Technology A | AIP …

Photoelectron and Auger peaks are central to most of the important uses of x-ray
photoelectron spectroscopy (XPS), and thus, they receive the most attention in many types of …

Employing state‐of‐the‐art and practical peak‐fitting and background modeling methods
(active approach), we obtained high quality fitting of the photoemission spectrum of Co 2p in …

Despite numerous tutorials and standards written to the technical community on X-ray
photoelectron spectroscopy (XPS), difficulties with data acquisition, analysis, and reporting …

Understanding fundamental material–property relationships in mixed-element catalyst
systems is crucial to advancing the viability of renewable electrochemical energy …