An accurate knowledge of lattice parameters of ScxAl1ÀxN is essential for understanding
the elastic and piezoelectric properties of this compound as well as for the ability to engineer …

Electron probe microanalysis is a nondestructive technique widely used to determine the
elemental composition of bulk samples. This was extended to layered specimens, with the …

Metallic glass thin films (MGTFs) are a recently developed class of alloy coatings with
potential applications ranging from biomedical devices to electrical components. Their …

A new standards-based scanning electron microscopy with the energy-dispersive X-ray
spectrometry (SEM–EDS) quantification method was used to analyze the thin-film coating of …

Electron probe microanalysis (EPMA) applies to solid samples of homogenous (bulk)
chemical composition and can usually not be applied to structures which are …

We have demonstrated a new data analysis method that enables nondestructive depth
profiling of a multilayer thin-film sample from energy-dispersive X-ray spectroscopy (EDX) …

The determination of the thickness and composition of thin films on substrates is important to
characterize layered sample systems. There are various techniques for the determination of …

NeXL is a collection of Julia language packages (libraries) for X-ray microanalysis data
processing. NeXLCore provides basic atomic and X-ray physics data and models including …

Electron probe microanalysis (EPMA) is a technique widely used to identify and quantify
materials. The most recent EPMA quantification methods use models that accurately …

New alloys that could operate at higher temperatures while having less weight are in
everincreasing demand, particularly in the transportation market. Advanced TiAl-based …