Characterized of glow-discharge deposited a-Si: H

H Fritzsche - Solar Energy Materials, 1980 - Elsevier
The study of hydrogenated amorphous silicon, a-Si: H has become an active and large
subfield of growing interest in noncrystalline semiconductors. This paper reviews recent …

Nanocrystalline materials

H Gleiter - … Structural and Functional Materials: Proceedings of an …, 1991 - Springer
Nanocrystalline solids are polycrystals the crystal size of which is a few (typically 1 to 10)
nanometers so that 50% or more of the solid consists of incoherent interfaces between …

[HTML][HTML] Nanostructured materials: basic concepts and microstructure

H Gleiter - Acta materialia, 2000 - Elsevier
Nanostructured Materials (NsM) are materials with a microstructure the characteristic length
scale of which is on the order of a few (typically 1–10) nanometers. NsM may be in or far …

The one phonon Raman spectrum in microcrystalline silicon

H Richter, ZP Wang, L Ley - Solid State Communications, 1981 - Elsevier
The red shift and the broadening of the Raman signal from microcrystalline silicon films is
described in terms of a relaxation in the q-vector selection rule for the excitation of the …

[图书][B] Optical properties of semiconductor nanocrystals

SV Gaponenko - 1998 - books.google.com
Low-dimensional semiconductor structures, often referred to as nanocrystals or quantum
dots, exhibit fascinating behavior and have a multitude of potential applications, especially …

Defects in crystals studied by Raman scattering

M Kitajima - Critical reviews in Solid state and Material Sciences, 1997 - Taylor & Francis
Raman studies of crystal defects are reviewed. Raman spectroscopy is a powerful technique
and has been used widely for investigating disordered structures. The degree of disorder in …

Raman scattering from hydrogenated microcrystalline and amorphous silicon

Z Iqbal, S Veprek - Journal of Physics C: Solid State Physics, 1982 - iopscience.iop.org
Raman scattering measurements on hydrogenated microcrystalline silicon prepared in a
hydrogen plasma at deposition temperatures between approximately= 65 and 400 degrees …

Raman scattering from small particle size polycrystalline silicon

Z Iqbal, S Vepřek, AP Webb, P Capezzuto - Solid State Communications, 1981 - Elsevier
Raman scattering measurements are reported on polycrystalline silicon films prepared in a
hydrogen plasma at temperatures between 70 and 400° C. The spectra show several …

Photoluminescence and Raman studies in thin-film materials: Transition from amorphous to microcrystalline silicon

G Yue, JD Lorentzen, J Lin, D Han, Q Wang - Applied Physics Letters, 1999 - pubs.aip.org
We measured photoluminescence (PL) and Raman spectra for films deposited by hot-wire
chemical vapor deposition using various hydrogen to silane ratios. We observed:(a) a PL …

Applicability of Raman scattering for the characterization of nanocrystalline silicon

C Ossadnik, S Vepřek, I Gregora - Thin solid films, 1999 - Elsevier
Applicability of Raman scattering for the characterization of nanocrystalline silicon -
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