CY Yam, L Meng, Y Zhang, GH Chen - Chemical Society Reviews, 2015 - pubs.rsc.org
Multiscale modeling has become a popular tool for research applying to different areas including materials science, microelectronics, biology, chemistry, etc. In this tutorial review …
L Meng, CY Yam, Y Zhang, R Wang… - The Journal of Physical …, 2015 - ACS Publications
The unique optical properties of nanometallic structures can be exploited to confine light at subwavelength scales. This excellent light trapping is critical to improve light absorption …
The continuous downsizing of modern electronic devices implies the increasing importance of quantum phenomena. As the feature sizes of transistors inch towards 10 nanometer …
L Meng, CY Yam, SK Koo, Q Chen… - Journal of Chemical …, 2012 - ACS Publications
A newly developed hybrid quantum mechanics and electromagnetics (QM/EM) method [Yam et al. Phys. Chem. Chem. Phys. 2011, 13, 14365] is generalized to simulate the real time …
TY Li, Q Zhan, W Chen, D Wang… - IEEE Transactions …, 2022 - ieeexplore.ieee.org
We present a new stabilized 3-D control volume finite element method (FEM) for massively parallel simulation of drift-diffusion transport in semiconductor devices. This new solver …
Today's most commonly used circuit models increasingly tend to lose their validity in circuit simulation due to rapid technological developments, miniaturization and increased …
L Meng, Z Yin, CY Yam, SK Koo, Q Chen… - The Journal of …, 2013 - pubs.aip.org
(2012)], the newly developed frequency-domain QM/EM method could effectively capture the dynamic properties of electronic devices over a broader range of operating frequencies …
J Chen, B Zhu, W Zhong, QH Liu - IEEE Transactions on …, 2010 - ieeexplore.ieee.org
A semianalytical spectral element method (SEM) is proposed for electromagnetic simulations of 3-D layered structures. 2-D spectral elements are employed to discretize the …
W Schoenmaker, P Meuris - IEEE Transactions on Computer …, 2002 - ieeexplore.ieee.org
This is the second paper in a series on the simulation of on-chip high-frequency effects. A computer-aided approach in three dimensions is advocated, describing high-frequency …