Germanium based field-effect transistors: Challenges and opportunities

PS Goley, MK Hudait - Materials, 2014 - mdpi.com
The performance of strained silicon (Si) as the channel material for today's metal-oxide-
semiconductor field-effect transistors may be reaching a plateau. New channel materials …

Ge (001) surface cleaning methods for device integration

P Ponath, AB Posadas, AA Demkov - Applied Physics Reviews, 2017 - pubs.aip.org
Germanium (Ge), with its higher hole and electron mobility than silicon, is a promising
candidate to replace silicon for future complementary metal-oxide-semiconductor (CMOS) …

Synthesis and characterization of hexagonal boron nitride as a gate dielectric

SK Jang, J Youn, YJ Song, S Lee - Scientific reports, 2016 - nature.com
Two different growth modes of large-area hexagonal boron nitride (h-BN) film, a
conventional chemical vapor deposition (CVD) growth mode and a high-pressure CVD …

Metal-induced layer exchange of group IV materials

K Toko, T Suemasu - Journal of Physics D: Applied Physics, 2020 - iopscience.iop.org
Layer exchange (LE) is an interesting phenomenon in which metal and semiconductor
layers exchange during heat treatment. A great deal of effort has been put into research on …

[HTML][HTML] Berberine protects against 6-OHDA-induced neurotoxicity in PC12 cells and zebrafish through hormetic mechanisms involving PI3K/AKT/Bcl-2 and Nrf2/HO-1 …

C Zhang, C Li, S Chen, Z Li, X Jia, K Wang, J Bao… - Redox biology, 2017 - Elsevier
Berberine (BBR) is a renowned natural compound that exhibits potent neuroprotective
activities. However, the cellular and molecular mechanisms are still unclear. Hormesis is an …

Border traps in Ge/III–V channel devices: Analysis and reliability aspects

E Simoen, DHC Lin, A Alian… - … on Device and …, 2013 - ieeexplore.ieee.org
The aim of this review paper is to describe the impact of so-called border traps (BTs) in high-
k gate oxides on the operation and reliability of high-mobility channel transistors. First, a …

Material Characterization of Ge1−x Sn x Alloys Grown by a Commercial CVD System for Optoelectronic Device Applications

A Mosleh, SA Ghetmiri, BR Conley… - Journal of electronic …, 2014 - Springer
High-quality compressive-strained Ge 1− x Sn x/Ge films have been deposited on Si (001)
substrate using a mainstream commercial chemical vapor deposition reactor. The growth …

Tetrahedral Structure Based on Triphenylgermanium for Quenching‐Resistant Multi‐Resonance Thermally Activated Delayed Fluorescence Emitters

HX Ni, JZ Zhu, JJ Hu, L Yuan, XJ Liao… - Advanced Optical …, 2024 - Wiley Online Library
The rigid planar architecture of multiple resonance thermally activated delayed fluorescence
(MR‐TADF) molecules employing boron/nitrogen (B/N) frameworks typically results in …

N-type doping of Ge by As implantation and excimer laser annealing

R Milazzo, E Napolitani, G Impellizzeri… - Journal of Applied …, 2014 - pubs.aip.org
The diffusion and activation of arsenic implanted into germanium at 40 keV with maximum
concentrations below and above the solid solubility (8× 10 19 cm− 3) have been studied …

Modeling and in situ probing of surface reactions in atomic layer deposition

Y Zheng, S Hong, G Psofogiannakis… - … applied materials & …, 2017 - ACS Publications
Atomic layer deposition (ALD) has matured into a preeminent thin film deposition technique
by offering a highly scalable and economic route to integrate chemically dissimilar materials …