We describe a stable method for calibrating digital waveforms and eye diagrams by use of
the measurement system response function and its regularized inverse. The function …

The NIST CTL has launched several new programs to support advances in 5G mmW and
multiple-antenna technology. The high levels of electronic device integration anticipated for …

Public cloud GPU clusters are becoming emerging platforms for training distributed deep
learning jobs. Under this training paradigm, the job scheduler is a crucial component to …

We present an analysis of the propagation of measurement uncertainty in microwave
transistor nonlinear models. As a case study, we focus on residual calibration uncertainty …

The Fourier transform and its counterpart for discrete time signals, the discrete Fourier
transform (DFT), are common tools in measurement science and application. Although …

We review the waveform metrology program developed over many years at the National
Institute of Standards and Technology. The goal of this program is to provide a measurement …

An analytical approach to compute the uncertainty of multiport scattering parameter
measurements is presented. First, the various uncertainty causes from the noise to the …

The goal of this paper is to provide a comparative analysis of the thermal impact on the
microwave performance of high electron-mobility transistors (HEMTs) based on GaAs and …

Redox-based random-access memory (ReRAM) has the potential to successfully address
the technological barriers that today's memory technologies face. One of its promising …

Closed-form solutions are presented for calculating the reflection coefficient with
corresponding uncertainty of metrology-grade 3.5 mm air-dielectric coaxial transmission …