IH Lee, YG Khim, J Eom, JY Kee, BK Choi, HJ Kim… - Applied Surface …, 2024 - Elsevier
We present a post-growth ex-situ annealing method to control the Curie temperature and magnetic anisotropy of Cr 2 Te 3 van der Waals ferromagnetic thin films. The as-grown Cr 2 …
HD Kim, M Gu, KM Lee, H Ahn, J Byun, G Yon… - Current Applied …, 2025 - Elsevier
Silicon nitride (SiN x) serves as the charge trap layer in current 3D NAND flash memory devices. The precise formation mechanism and electronic structure of localized defect trap …
In situ reflection high-energy electron diffraction (RHEED) is a powerful technique for monitoring surface states and offers invaluable insights into thin film growth. However …
Phyllosilicates are essential materials for novel implementations in two-dimensional based optoelectronic technologies. These naturally occurring minerals exhibit properties that can …
JH Yang, H Kang, HJ Kim, T Kim, H Ahn, TG Rhee… - Digital …, 2024 - pubs.rsc.org
We present a comprehensive data platform for 2D materials research, https://2DMat. ChemDX. org, and a newly constructed 2D database collected through the platform. This …
W Wang, X Zhang, W Wang, Y Xue, D Sheng… - …, 2024 - iopscience.iop.org
The revelation of MoS 2 as an efficient electromagnetic wave (EMW) absorbing material has ratcheted up people's attention to other transition metal dichalcogenides (TMDs). To date …
C Kim, MY Jung, YG Khim, KJ Lee, YJ Chang… - arXiv preprint arXiv …, 2024 - arxiv.org
Sr-doped nickelate, Nd1-xSrxNiO3 (NSNO), perovskite thin films and Ruddlesden-Popper (RP) phases are actively investigated because of their physical properties, such as the metal …