Recent progress of laser processing technology in micro-LED display manufacturing: A review

L Song, X Yong, P Zhang, S Song, K Chen… - Optics & Laser …, 2025 - Elsevier
Micro-LED undoubtedly stands out as a highly anticipated technology when it comes to the
innovation of future display technologies. Micro-LED technology surpasses traditional …

Emergence of high quality sputtered III-nitride semiconductors and devices

N Izyumskaya, V Avrutin, K Ding, Ü Özgür… - Semiconductor …, 2019 - iopscience.iop.org
This article provides an overview of recent development of sputtering method for high-quality
III-nitride semiconductor materials and devices. Being a mature deposition technique widely …

Comparative study of GaN-based ultraviolet LEDs grown on different-sized patterned sapphire substrates with sputtered AlN nucleation layer

S Zhou, H Hu, X Liu, M Liu, X Ding, C Gui… - Japanese Journal of …, 2017 - iopscience.iop.org
GaN-based ultraviolet-light-emitting diodes (UV LEDs) with 375 nm emission were grown on
different-sized patterned sapphire substrates (PSSs) with ex situ 15-nm-thick sputtered AlN …

The limits of the post‐growth optimization of AlN thin films grown on Si (111) via magnetron sputtering

D Solonenko, C Schmidt, C Stoeckel… - … status solidi (b), 2020 - Wiley Online Library
Hexagonal aluminium nitride (AlN) thin films prepared by the reactive magnetron sputtering
method usually undergo post‐growth annealing treatment aimed at the improvement of …

Thickness dependence of Al0. 88Sc0. 12N thin films grown on silicon

K Knisely, E Douglas, J Mudrick, M Rodriguez, P Kotula - Thin Solid Films, 2019 - Elsevier
The thickening behavior of aluminum scandium nitride (Al 0.88 Sc 0.12 N) films grown on Si
(111) substrates has been investigated experimentally using X-ray diffraction (XRD) …

Epitaxial growth of single-crystalline AlN layer on Si (111) by DC magnetron sputtering at room temperature

IS Shin, J Kim, D Lee, D Kim, Y Park… - Japanese Journal of …, 2018 - iopscience.iop.org
The epitaxial growth of an AlN layer on a Si (111) substrate at room temperature by DC
magnetron sputtering was investigated. The predeposition of a 5-nm-thick Al layer on the Si …

Growth mechanisms of GaN epitaxial films grown on ex situ low-temperature AlN templates on Si substrates by the combination methods of PLD and MOCVD

H Wang, Z Lin, W Wang, G Li, J Luo - Journal of Alloys and Compounds, 2017 - Elsevier
Three kinds of ex situ low-temperature AlN (LT-AlN) templates grown on Si substrates by
pulsed laser deposition (PLD) are employed to grow GaN epitaxial films by metal organic …

Initial growth control of GaN on Si with physical-vapor-deposition-AlN seed layer for high-quality GaN templates

H Wang, H Sodabanlu, Y Daigo, T Seino… - Applied Physics …, 2016 - iopscience.iop.org
An ex situ AlN seed layer was formed by physical vapor deposition (PVD) on a Si substrate,
aiming at the production of high-quality GaN on Si by metal–organic vapor-phase epitaxy. A …

Effects of low temperature buffer layer on all-sputtered epitaxial GaN/AlN film on Si (111) substrate

T Nagata, Y Suemoto, Y Ueoka… - Japanese Journal of …, 2021 - iopscience.iop.org
The effect of an Al buffer layer on the growth of AlN on a Si (111) substrate was investigated
to develop an all-sputtered GaN film on a Si (111) template substrate. The X-ray diffraction …

Optical characteristics of nanocrystalline AlxGa1− xN thin films deposited by hollow cathode plasma-assisted atomic layer deposition

E Goldenberg, C Ozgit-Akgun, N Biyikli… - Journal of Vacuum …, 2014 - pubs.aip.org
Gallium nitride (GaN), aluminum nitride (AlN), and Al x Ga 1− x N films have been deposited
by hollow cathode plasma-assisted atomic layer deposition at 200 C on c-plane sapphire …