Review of hydrogen embrittlement in metals: hydrogen diffusion, hydrogen characterization, hydrogen embrittlement mechanism and prevention

X Li, X Ma, J Zhang, E Akiyama, Y Wang… - Acta Metallurgica Sinica …, 2020 - Springer
Hydrogen dissolved in metals as a result of internal and external hydrogen can affect the
mechanical properties of the metals, principally through the interactions between hydrogen …

A review: On the development of low melting temperature Pb-free solders

HR Kotadia, PD Howes, SH Mannan - Microelectronics Reliability, 2014 - Elsevier
Pb-based solders have been the cornerstone technology of electronic interconnections for
many decades. However, with legislation in the European Union and elsewhere having …

Recent advances on kinetic analysis of solder joint reactions in 3D IC packaging technology

KN Tu, Y Liu - Materials Science and Engineering: R: Reports, 2019 - Elsevier
We review five solder joint reactions in 3D IC packaging technology which are of wide
interest:(1) Scallop-type growth of Cu 6 Sn 5 in solid-liquid interdiffusion reaction,(2) Whisker …

Failure mechanisms of solder interconnects under current stressing in advanced electronic packages

YC Chan, D Yang - Progress in Materials Science, 2010 - Elsevier
The pursuit of greater performance in microelectronic devices has led to a shrinkage of
bump size and a significant increase in electrical current. This has resulted in a high current …

Electromigration and thermomigration in Pb-free flip-chip solder joints

C Chen, HM Tong, KN Tu - Annual Review of Materials …, 2010 - annualreviews.org
Pb-free solders have replaced Pb-containing SnPb solders in the electronic packaging
industry due to environmental concerns. Both electromigration (EM) and thermomigration …

Role of diffusion anisotropy in β-Sn in microstructural evolution of Sn-3.0 Ag-0.5 Cu flip chip bumps undergoing electromigration

ML Huang, JF Zhao, ZJ Zhang, N Zhao - Acta Materialia, 2015 - Elsevier
The anisotropy of β-Sn grain is becoming the most crucial factor to dominate the
electromigration (EM) behavior with the downsizing of solder bumps. When the c-axis of β …

Kinetics of intermetallic phase formation at the interface of Sn–Ag–Cu–X (X= Bi, In) solders with Cu substrate

E Hodulova, M Palcut, E Lechovič, B Šimeková… - Journal of Alloys and …, 2011 - Elsevier
The effects of Bi and In additions on intermetallic phase formation in lead-free solder joints of
Sn–3.7 Ag–0.7 Cu; Sn–1.0 Ag–0.5 Cu–1.0 Bi and Sn–1.5 Ag–0.7 Cu–9.5 In (composition …

A new failure mechanism of electromigration by surface diffusion of Sn on Ni and Cu metallization in microbumps

YW Chang, C Hu, HY Peng, YC Liang, C Chen… - Scientific reports, 2018 - nature.com
Microbumps in three-dimensional integrated circuit now becomes essential technology to
reach higher packaging density. However, the small volume of microbumps dramatically …

Investigation of diffusion behavior in Cu–Sn solid state diffusion couples

Y Yuan, Y Guan, D Li, N Moelans - Journal of Alloys and Compounds, 2016 - Elsevier
The diffusion behaviors and diffusion parameters of intermetallic compounds (IMCs) formed
in Cu–Sn diffusion couples were investigated at the temperature range of 130° C–200° C …

Rapid Cu6Sn5 growth at liquid Sn/solid Cu interfaces

MAAM Salleh, SD McDonald, H Yasuda, A Sugiyama… - Scripta Materialia, 2015 - Elsevier
In situ observations of the reaction between solid Cu in contact with molten Sn–0.7 wt.% Cu
were achieved using a synchrotron X-ray imaging technique. It was found that, upon wetting …