Integrated optical frequency domain reflectometry device for characterization of complex integrated devices

LA Bru, D Pastor, P Muñoz - Optics Express, 2018 - opg.optica.org
Because of the demand for advanced measurement systems in the field of modern photonic
integrated circuits, optical frequency domain reflectometry (OFDR) is a robust technique for …

Diagnostics and characterization of photonic circuits by wide-field spatiotemporal imaging

D Nuzhdin, L Pattelli, S Nocentini, DS Wiersma - ACS Photonics, 2020 - ACS Publications
The growing diffusion of integrated photonic technologies requires fast and noninvasive
quality control techniques for mass production. We present a general diagnostic technique …

[PDF][PDF] Integrated widely tunable laser systems at 1300 and 1550 nm as swept sources for optical coherence tomography

J Hazan - 2023 - research.tue.nl
This work concerns the development of monolithically integrated InP widely tunable laser
systems at 1300 and 1550 nm, suitable to achieve multispectral optical coherence …

[PDF][PDF] Process control modules for photonic integration technology

D Pustakhod - 2018 - research.tue.nl
Attempts to miniaturize optical devices have led to the development of an integrated
approach, similar to the one which is dominating in microelectronics in last decades. The …