Leakage current is making a substantial contribution to the power dissipation in nanometer
regime due to continued technology scaling. The problem is further accentuated with the …

Process variation has already emerged as a major concern in design of multi‐processor
system on chips (MPSoC). In recent years, there have been several attempts to bring …

The dominance of leakage currents in circuit design has been impelled by steady
downscaling of MOSFET into nanometer regime, and has become a significant component …

Leakage power has already become the major contributor to the total on-chip power
consumption, rendering its estimation a necessary step in the IC design flow. The problem is …

This paper proposes a hybrid gate-level leakage model for the use with the Monte Carlo
(MC) analysis approach, which combines a lookup table (LUT) model with a first-order …

Process variation has already emerged as a major concern in design of Multi-Processor
System on Chips (MPSoC). In recent years, there have been several attempts to bring …

In this thesis, a fully statistical multivariate modeling approach is introduced to describe
variability in integrated circuit design. The approach supports Gaussian as well as almost …

This paper presents an efficient approach to statistical leakage analysis (SLA) that can
estimate the arbitrary n-sigma leakage currents of the VLSI system for the probability density …