Deep learning in electron microscopy

JM Ede - Machine Learning: Science and Technology, 2021 - iopscience.iop.org
Deep learning is transforming most areas of science and technology, including electron
microscopy. This review paper offers a practical perspective aimed at developers with …

Automated and autonomous experiments in electron and scanning probe microscopy

SV Kalinin, M Ziatdinov, J Hinkle, S Jesse, A Ghosh… - ACS …, 2021 - ACS Publications
Machine learning and artificial intelligence (ML/AI) are rapidly becoming an indispensable
part of physics research, with domain applications ranging from theory and materials …

Plug-and-play priors for bright field electron tomography and sparse interpolation

S Sreehari, SV Venkatakrishnan… - IEEE Transactions …, 2016 - ieeexplore.ieee.org
Many material and biological samples in scientific imaging are characterized by nonlocal
repeating structures. These are studied using scanning electron microscopy and electron …

[HTML][HTML] Implementing an accurate and rapid sparse sampling approach for low-dose atomic resolution STEM imaging

L Kovarik, A Stevens, A Liyu, ND Browning - Applied Physics Letters, 2016 - pubs.aip.org
While aberration correction for scanning transmission electron microscopes (STEMs)
dramatically increased the spatial resolution obtainable in the images of materials that are …

[HTML][HTML] ICON: 3D reconstruction with 'missing-information'restoration in biological electron tomography

Y Deng, Y Chen, Y Zhang, S Wang, F Zhang… - Journal of structural …, 2016 - Elsevier
Electron tomography (ET) plays an important role in revealing biological structures, ranging
from macromolecular to subcellular scale. Due to limited tilt angles, ET reconstruction …

Partial scanning transmission electron microscopy with deep learning

JM Ede, R Beanland - Scientific reports, 2020 - nature.com
Compressed sensing algorithms are used to decrease electron microscope scan time and
electron beam exposure with minimal information loss. Following successful applications of …

Development of a fast electromagnetic beam blanker for compressed sensing in scanning transmission electron microscopy

A Béché, B Goris, B Freitag, J Verbeeck - Applied Physics Letters, 2016 - pubs.aip.org
The concept of compressed sensing was recently proposed to significantly reduce the
electron dose in scanning transmission electron microscopy (STEM) while still maintaining …

Informatics and data science in materials microscopy

PM Voyles - Current Opinion in Solid State and Materials Science, 2017 - Elsevier
The breadth, complexity, and volume of data generated by materials characterization using
various forms of microscopy has expanded significantly. Combined with increases in …

Flexible STEM with simultaneous phase and depth contrast

S Seifer, L Houben, M Elbaum - Microscopy and microanalysis, 2021 - cambridge.org
Recent advances in scanning transmission electron microscopy (STEM) have rekindled
interest in multi-channel detectors and prompted the exploration of unconventional scan …

Spatial and spectral dynamics in STEM hyperspectral imaging using random scan patterns

A Zobelli, SY Woo, A Tararan, LHG Tizei, N Brun, X Li… - Ultramicroscopy, 2020 - Elsevier
The evolution of the scanning modules for scanning transmission electron microscopes
(STEM) allows now to generate arbitrary scan pathways, an approach currently explored to …